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Structured guided diffusion models for industrial defect image generation
DOI:10.1016/j.knosys.2025.114642.png)
Abstract
En 中文
• Propose a Structured-GDM framework for controllable defect generation. • Design a structured architecture for the independent control of three elements. • Develop a multiple-class training scheme for “one-for-all” defect generation. • Demonstrate superior performance in generating high-quality defect samples.Demonstrate superior performance in generating high-quality defect samples.
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7.6
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1.3W
Citations:
4.5W
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