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Structured guided diffusion models for industrial defect image generation

delete2025-10-13
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PRE
AI
Y
Yulai Xie
X
Xiaoning Pi
Y
Yang Zhang
F
Fang Ren
DOI:10.1016/j.knosys.2025.114642delete
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Abstract

Abstract

En 中文
• Propose a Structured-GDM framework for controllable defect generation. • Design a structured architecture for the independent control of three elements. • Develop a multiple-class training scheme for “one-for-all” defect generation. • Demonstrate superior performance in generating high-quality defect samples.Demonstrate superior performance in generating high-quality defect samples.

Journal

K
Knowledge-Based Systems
IF:
7.6
Papers:
1.3W
Citations:
4.5W

Organization

C
china telecom research institute
Scholars:
93
Papers: 45
Citations: 0
H
hitachi china research laboratory
Scholars:
4
Papers: 2
Citations: 0
U
university of science and technology beijing
Scholars:
1.3W
Papers: 4.5K
Citations: 2
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