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Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm
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DOI：10.1364/OL.38.004723.png)
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Abstract
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Structured illumination microscopy (SIM) is a powerful technique for obtaining super-resolved fluorescence maps of samples, but it is very sensitive to aberrations or misalignments affecting the excitation patterns. Here, we present a reconstruction algorithm that is able to process SIM data even if the illuminations are strongly distorted. The approach is an extension of the recent blind-SIM technique, which reconstructs simultaneously the sample and the excitation patterns without a priori information on the latter. Our algorithm was checked on synthetic and experimental data using distorted and nondistorted illuminations. The reconstructions were similar to that obtained by up-to-date SIM methods when the illuminations were periodic and remained artifact-free when the illuminations were strongly distorted. (C) 2013 Optical Society of America
Keywords:
RESOLUTION
SUPERRESOLUTION
LIMIT
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