Return
Structured pattern embedding and efficient global dependency modeling for lightweight image super-resolution
DOI:10.1016/j.cviu.2026.104922.png)
Abstract
En 中文
• Achieves state-of-the-art performance under strict parameter and FLOP budgets.
• Employs parallel-hierarchical pattern embedding for rich, diverse local features.
• Bridges local fine-grained detail and global context in lightweight SISR.
Keywords:
Lightweight image super-resolution
Efficient global modeling
Pattern selection
Spatial pattern embedding
Journal
IF:
3.5
Papers:
450
Citations:
7.3K
Organization
No organization information available
Cited Papers
No cited papers available

