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Study on generalized analysis model for fringe pattern profilometry

delete2008-01-01
delete16
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OA
AI
Y
Yingsong Hu *
J
Jiangtao Xi
Z
Zongkai Yang
E
Enbang Li
J
J.F. Chicharo
DOI:10.1109/TIM.2007.909417delete
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Abstract

Abstract

En 中文
This paper presents a generalized analysis model for fringe pattern profilometry. We mathematically derived a new analysis model that gives a more general expression of the relationship between projected and deformed fringe patterns. Meanwhile, based on the proposed generalized model, a new algorithm is presented to retrieve 3-D surfaces from nonlinearly distorted fringes. Without any prior knowledge about the projection system, we still can obtain very accurate measurement results by using a generalized analysis model and a proposed algorithm. Computer simulation and experimental results show that the generalized model and the proposed algorithm can significantly improve the 3-D reconstruction precision, especially when the projected fringe pattern is nonlinearly distorted.
Keywords:
fourier transform profilometry (FTP)
fringe pattern analysis
fringe pattern profilometry (FPP)
generalized analysis model
shift estimation (SE)

Journal

IEEE Transactions on Instrumentation and Measurement cover
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
Papers:
2.0W
Citations:
5.8W

Organization

T
tianjin university
Scholars:
8.0W
Papers: 5.8W
Citations: 88
U
University of Wollongong
Scholars:
1.3W
Papers: 1.6W
Citations: 2.8W
Cited Papers

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