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Super-resolution sensing with a randomly scattering analyzer
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DOI：10.1103/PhysRevResearch.3.L042045.png)
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Abstract
En 中文
A randomly scattering analyzer located in the far field and with a fixed aperture, in front of a multielement detector, is introduced as a means to access enhanced sensing information associated with far-subwavelength spatial features. This sensing method allows improved spatial resolution with coherent fields scattered from a moving object, or some other relative change that causes a modified field incident on the detector aperture. Experimental optical speckle correlation data with a translated diffusing structure show the salient features, and understanding in relation to the experimental variables is supported by numerical simulations. The conclusion is that more heavily scattering analyzers provide better spatial resolution because the measurements are more sensitive to changes in the incident field. Such randomly scattering analyzers offer a dimension for sensitive coherent optical metrology related to various sensing and motion application domains requiring large offset distances.
Keywords:
MICROSCOPY
RESOLUTION
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