Surface EMG-based Sketching Recognition Using Two Analysis Windows and Gene Expression Programming

Zhongliang Yang

doi:10.3389/fnins.2016.00445

Return

Surface EMG-based Sketching Recognition Using Two Analysis Windows and Gene Expression Programming

2016-10-14

杨钟亮 (Zhongliang Yang) *

Yumiao Chen

DOI：10.3389/fnins.2016.00445

Original

Save

View PDF

Abstract

En 中文

Sketching is one of the most important processes in the conceptual stage of design. Previous studies have relied largely on the analyses of sketching process and outcomes; whereas surface electromyographic (sEMG) signals associated with sketching have received little attention. In this study, we propose a method in which 11 basic one-stroke sketching shapes are identified from the sEMG signals generated by the forearm and upper arm muscles from 4 subjects. Time domain features such as integrated electromyography, root mean square and mean absolute value were extracted with analysis windows of two length conditions for pattern recognition. After reducing data dimensionality using principal component analysis, the shapes were classified using Gene Expression Programming (GEP). The performance of the GEP classifier was compared to the Back Propagation neural network (BPNN) and the Elman neural network (ENN). Feature extraction with the short analysis window (250 ms with a 250 ms increment) improved the recognition rate by around 6.4% averagely compared with the long analysis window (2500 ms with a 2500 ms increment). The average recognition rate for the eleven basic one-stroke sketching patterns achieved by the GEP classifier was 96.26% in the training set and 95.62% in the test set, which was superior to the performance of the BPNN and ENN classifiers. The results show that the GEP classifier is able to perform well with either length of the analysis window. Thus, the proposed GEP model show promise for recognizing sketching based on sEMG signals.

Keywords:

sketching

surface electromyography

gene expression programming

muscle-computer interface

pattern recognition

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.