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Synapse classification and localization in Electron Micrographs
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DOI：10.1016/j.patrec.2013.06.001.png)
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Abstract
En 中文
Classification and detection of biological structures in Electron Micrographs (EM) is a relatively new large scale image analysis problem. The primary challenges are in modeling diverse visual characteristics and development of scalable techniques. In this paper we propose novel methods for synapse detection and localization, an important problem in connectomics. We first propose an attribute based descriptor for characterizing synaptic junctions. These descriptors are task specific, low dimensional and can be scaled across large image sizes. Subsequently, techniques for fast localization of these junctions are proposed. Experimental results on images acquired from a mammalian retinal tissue compare favorably with state of the art descriptors used for object detection. (C) 2013 Elsevier B. V. All rights reserved.
Keywords:
Connectomics
Detection
Feature descriptors
Electron Micrographs
Journal
IF:
3.3
Papers:
7.8K
Citations:
1.6W
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