Terahertz pulsed spectroscopic imaging using optimized binary masks

doi:10.1063/1.3271030

Terahertz pulsed spectroscopic imaging using optimized binary masks

2009-12-10

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DOI：10.1063/1.3271030

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We report the development of a terahertz pulsed spectroscopic imaging system based on the concept of compressive sensing. A single-point terahertz detector, together with a set of 40 optimized two-dimensional binary masks, was used to measure the terahertz waveforms transmitted through a sample. Terahertz time- and frequency-domain images of the sample comprising 20 x 20 pixels were subsequently reconstructed. We demonstrate that both the spatial distribution and the spectral characteristics of a sample can be obtained by this means. Compared with conventional terahertz pulsed imaging, no raster scanning of the object is required, and ten times fewer terahertz spectra need be taken. It is therefore ideal for real-time imaging applications. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3271030]

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Terahertz pulsed spectroscopic imaging using optimized binary masks

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