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Testing serial correlation in semiparametric panel data models

delete1998-12-01
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Q. Li
C
C. Hsiao
DOI:10.1016/S0304-4076(98)00013-Xdelete
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Abstract

Abstract

En 中文
We propose three test statistics for testing serial correlation in a semiparametric partially linear panel data model that could allow lagged dependent variables as explanatory variables. The first is for testing zero first-order serial correlation, the second for testing higher-order serial correlations and the third testing for individual effects. The test statistics are shown to have asymptotic normal or chi-square distributions under the null hypothesis of a martingale difference error process. We conduct some Monte Carlo experiments to examine the finite sample performances of the proposed tests. We also discuss the generalization to testing serial correlation in a nonparametric framework. (C) 1998 Elsevier Science S.A. All rights reserved.
Keywords:
partially linear model
dynamic panel data model
testing serial correlation
individual effects
semiparametric estimation
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Journal

Journal of Econometrics cover
Journal of Econometrics
IF:
4
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5.2K
Citations:
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