.png){kind=icon}
.png){kind=icon}
Return
The nearest MPSS pattern in data envelopment analysis
.png){kind=icon}
PRE
AI
DOI：10.1007/s10479-014-1670-y.png)
.png){kind=icon}
Original request for help.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
The concept of Returns to scale is an important topic in data envelopment analysis since it identifies whether the expansion or contraction of the unit under assessment is beneficial. The quantity of the beneficial expansion or contraction is determined by introducing a most productive scale size (MPSS) pattern. This paper aims at introducing a notion of the nearest MPSS pattern which is the closest MPSS pattern among the others. By the aid of this pattern, a unit would be able to reach its optimal size more easily and by small changes in its inputs and outputs. Finding such a pattern is investigated through BCC and multiplicative models.
Keywords:
Data envelopment analysis
Returns to scale
Most productive scale size
Multiplicative model
BCC model
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.
Journal
IF:
4.5
Papers:
8.0K
Citations:
2.1W