Thermally Activated Homologous Defect Engineering for Ultra-Stable Ultrahigh-Nickel Cathodes via Self-Driven Short-Range Disorder

doi:10.1016/j.ensm.2025.104750

Thermally Activated Homologous Defect Engineering for Ultra-Stable Ultrahigh-Nickel Cathodes via Self-Driven Short-Range Disorder

2025-11-19

0

PRE

AI

DOI：10.1016/j.ensm.2025.104750

Original

Original request for help

Save

Abstract

En 中文

Nickel-rich layered oxides are promising cathode materials for high-energy lithium batteries but suffer from structural degradation and interfacial side reactions. Conventional modification strategies such as elemental doping and surface coating are often limited by complexity, cost, and unclear mechanisms. Inspired by architectural wedge-peg structures, we propose a homologous defect engineering strategy via thermal activation to construct self-driven bulk-phase heterostructures and an ultrathin inert surface layer. The wedge pegs effectively mitigate lattice strain, while the in-situ formed surface layer suppresses electrolyte side reactions, synergistically enhancing structural and interfacial stability. In-situ XRD and DRT analyses reveal the suppressed H2–H3 phase transition and optimized kinetics. The modified cathode exhibits exceptional cycling stability (76.81% capacity retention after 300 cycles at 0.5C) and high-voltage tolerance (92.86% after 100 cycles at 4.5V). This work provides a novel, cost-effective, and controllable approach for designing high-performance ultrahigh-nickel cathodes, with great potential for solid-state batteries.

Thermally Activated Homologous Defect Engineering for Ultra-Stable Ultrahigh-Nickel Cathodes via Self-Driven Short-Range Disorder

Abstract

Journal

Organization