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Three-dimensional imaging through patterned type-1 microscopy
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DOI：10.1364/OE.443895.png)
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Abstract
En 中文
We report a scanning non-confocal fluorescence microscopy scheme that provides images with optical sectioning and with a lateral resolution that surpasses by a factor of two the diffraction resolution limit. This technique is based on the type-1 microscopy concept combined with patterned illumination. The method does not require the application of phase-shifting or post-processing algorithms and provides artifact-free superresolved 3D images. We have validated the theory by means of experimental data. (c) 2021 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
Keywords:
FIELD FLUORESCENCE MICROSCOPY
LATERAL RESOLUTION
EXTENDED RESOLUTION
OPTICAL-SYSTEMS
ILLUMINATION
IMPROVEMENT
SUPERRESOLUTION
ENHANCEMENT
LIMIT
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