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Total-reflection-based microscope compatible with X-ray and visible light for sample positioning
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DOI：10.1107/s1600577526003127.png)
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Abstract
En 中文
Sample positioning in X-ray imaging is often technically demanding and involves radiation exposure to the sample. For easier and damage-free positioning, the integration of a visible-light microscope is an effective and widely adopted approach. However, such visible-light microscopes require careful calibration of the objective optic against the X-ray microscope, which introduces additional challenges. To address this issue, we propose a simple total-reflection-based microscope compatible with X-rays and visible light using aWolter mirror which functions as both X-ray condenser optic and visible-light objective optic. Calibrating our visible-light microscope requires only simple adjustment of an optical lens and three planar mirrors, while no adjustment of the objective optic. We constructed our proposed system for a soft X-ray ptychography system and successfully demonstrated the simple calibration of the visible-light microscope, which was then applied to position a biological sample without delivering a radiation dose.
Keywords:
sample positioning
visible light
soft X-ray microscope
Wolter mirror
biological specimen
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