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Using likely invariants for test data generation
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DOI：10.1016/j.jss.2020.110549.png)
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Abstract
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Various approaches have been developed to tackle the problem of automatic test data generation. Among them search-based methods use metaheuristic algorithms to guide search in the input space of the program under test. This paper presents a new approach for improving search-based test data generation methods. This approach is based on learning the relationships between program input values and program parts covered by those values. The learned relationships are used to accelerate achieving test coverage goals. We introduce the concepts of branch likely invariant and path likely invariant as the basis for the learning method. In addition, we utilize simple predicates (based on some predefined templates) over program input variables to generate better initial candidate solutions, and use the mutation of the mentioned predicates to cover unexplored program parts. The current version of the proposed approach only considers numeric and string input parameters. To evaluate the performance of the proposed approach, a series of experiments have been carried out on a number of different benchmark programs. Through experiments and analysis, we show that the proposed approach enhances the effectiveness of common search-based test data generation methods, in terms of the coverage percentage. (C) 2020 Published by Elsevier Inc.
Keywords:
Search-based test data generation
Metaheuristic algorithms
Branch likely invariants
Path likely invariants
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