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Video Diffusion Posterior Sampling for Seeing Beyond Dynamic Scattering Layers

delete2025-08-13
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PRE
AI
T
Tae‐Sung Kwon
G
Gookho Song
Y
Yoo-Sun Kim
J
Jeongsol Kim
J
Jong Chul Ye
M
Mooseok Jang
DOI:10.1109/TPAMI.2025.3598457delete
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Abstract

Abstract

En 中文
Imaging through scattering is challenging, as even a thin layer can randomly perturb light propagation and obscure hidden objects. Accurate closed-form modeling of forward scattering remains difficult, particularly for dynamically varying or thick layers. Here, we introduce a plug-and-play inverse solver based on video diffusion models with a physically grounded forward model tailored to dynamic scattering layers. Our method extends Diffusion Posterior Sampling (DPS) to the spatio-temporal domain, thereby capturing statistical correlations between video frames and scattered signals more effectively. Leveraging these temporal correlations, our approach recovers high-resolution spatial details that spatial-only methods typically fail to reconstruct. We also propose an inference-time optimization with a lightweight mapping network, enabling joint estimation of low-dimensional forward-model parameters without additional training. This joint optimization significantly enhances adaptability to unknown, time-varying degradations, making our method suitable for blind inverse scattering problems. We validate across diverse conditions, including different scene types, layer thicknesses, and scene-layer distances. And real-world experiments using multiple datasets confirm the robustness and effectiveness of our approach, even under real noise and forward-model approximation mismatches. Finally, we validate our method as a general video-restoration framework across dehazing, deblurring, inpainting, and blind restoration under complex optical aberrations.
Keywords:
Video reconstruction
imaging through scattering
video diffusion models
and diffusion-based inverse problem solvers

Journal

IEEE Transactions on Pattern Analysis and Machine Intelligence cover
IEEE Transactions on Pattern Analysis and Machine Intelligence
IF:
18.6
Papers:
831
Citations:
9.8W

Organization

No organization information available