Visual defect obfuscation based self-supervised anomaly detection

YeongHyeon Park

doi:10.1038/s41598-024-69698-5

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Visual defect obfuscation based self-supervised anomaly detection

2024-08-14

DOI：10.1038/s41598-024-69698-5

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Abstract

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Due to scarcity of anomaly situations in the early manufacturing stage, an unsupervised anomaly detection (UAD) approach is widely adopted which only uses normal samples for training. This approach is based on the assumption that the trained UAD model will accurately reconstruct normal patterns but struggles with unseen anomalies. To enhance the UAD performance, reconstruction-by-inpainting based methods have recently been investigated, especially on the masking strategy of suspected defective regions. However, there are still issues to overcome: (1) time-consuming inference due to multiple masking, (2) output inconsistency by random masking, and (3) inaccurate reconstruction of normal patterns for large masked areas. Motivated by this, this study proposes a novel reconstruction-by-inpainting method, dubbed Excision And Recovery (EAR), that features single deterministic masking based on the ImageNet pre-trained DINO-ViT and visual obfuscation for hint-providing. Experimental results on the MVTec AD dataset show that deterministic masking by pre-trained attention effectively cuts out suspected defective regions and resolves the aforementioned issues 1 and 2. Also, hint-providing by mosaicing proves to enhance the performance than emptying those regions by binary masking, thereby overcomes issue 3. The proposed approach achieves a high performance without any change of the model structure. Promising results are shown through laboratory tests with public industrial datasets. To suggest EAR be possibly adopted in various industries as a practically deployable solution, future steps include evaluating its applicability in relevant manufacturing environments.

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