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Wavelet transform based method of measuring multi-frequency electrostatic force microscopy dynamic process
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DOI：10.7498/aps.71.20212095.png)
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Abstract
En 中文
Electrostatic force microscopy (EFM) has high sensitivity and lateral resolution, and it is widely used tomeasure the electrostatic properties of new energy materials. The time-resolved electrostatic force microscopetechnology is used to measure the dynamic electrical properties of materials, pump detection method commonlyused in this technology has problems such as complex equipment, high cost, and uncertainty in themeasurement. In this work the method of directly measuring the time domain is adopted. This method reducesthe complexity of measurement. By using the multi-frequency or high-frequency excitation method, thesimultaneous measurement of multiple EFM parameters and the improvement of time resolution can beachieved, reaching a time resolution of microseconds, and by applying wavelet transform to the tip signalobtained by the measurement the dynamic electrical properties of the materials can be extracted. Applying thistechnology to simulation experiments, it is possible to measure the dynamic potential changes and thecharacteristic time parameter of ion movement in the microsecond-level electrical dynamic process of thesimulated battery materials.
Keywords:
multi-frequency electrostatic force microscopy
time resolution
dynamic measurement
wavelet transform
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