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Why and How: Knowledge-Guided Learning for Cross-Spectral Image Patch Matching

delete2026-08-05
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PRE
AI
C
Chuang Yu
Y
Yunpeng Liu
J
Jinmiao Zhao
A
Ao Chen
X
Xiujun Shu
B
Bo Wang
Z
Zelin Shi
X
Xiangyu Yue
DOI:10.1109/tip.2026.3718416delete
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Abstract

Abstract

En 中文
Recently, cross-spectral image patch matching based on feature relation learning has attracted extensive attention. However, existing methods focus on mining richer feature relations by building complex relation extraction structures. Meanwhile, performance bottlenecks have gradually emerged. To address this, we make the first attempt to explore a stable and efficient bridge between descriptor learning and metric learning, and construct a Knowledge-Guided Learning Network (KGL-Net), which achieves significant performance improvements while abandoning complex network structures. Specifically, we find that there is feature extraction consistency between metric learning based on feature difference learning and descriptor learning based on Euclidean distance. This provides the foundation for bridge building. To ensure the stability and efficiency of the constructed bridge, on the one hand, we conduct an in-depth exploration of 20 combined network architectures. On the other hand, a feature-guided loss is constructed to achieve mutual guidance of features. In addition, unlike existing methods, we consider that the feature mapping ability of the metric branch should receive more attention. Therefore, a hard negative sample mining for metric learning (HNSM-M) strategy is constructed. To the best of our knowledge, this is the first time that hard negative sample mining for metric networks has been implemented and brings significant performance gains. Extensive experimental results show that our KGL-Net achieves SOTA performance in multiple cross-spectral image patch matching datasets. Our code is available at https://github.com/YuChuang1205/KGL-Net
Keywords:
Combined network architectures
cross-spectral image patch matching
feature extraction consistency
hard negative sample mining
knowledge-guided learning

Journal

IEEE Transactions on Image Processing cover
IEEE Transactions on Image Processing
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13.7
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