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X-ray optics simulation using Gaussian superposition technique

delete2011-09-15
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OA
AI
M
Mourad Idir *
M
Moisés Cywiak
A
A. Morales
M
Mohammed H. Modi
DOI:10.1364/OE.19.019050delete
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Abstract

Abstract

En 中文
We present an efficient method to perform x-ray optics simulation with high or partially coherent x-ray sources using Gaussian superposition technique. In a previous paper, we have demonstrated that full characterization of optical systems, diffractive and geometric, is possible by using the Fresnel Gaussian Shape Invariant (FGSI) previously reported in the literature. The complex amplitude distribution in the object plane is represented by a linear superposition of complex Gaussians wavelets and then propagated through the optical system by means of the referred Gaussian invariant. This allows ray tracing through the optical system and at the same time allows calculating with high precision the complex wave-amplitude distribution at any plane of observation. This technique can be applied in a wide spectral range where the Fresnel diffraction integral applies including visible, x-rays, acoustic waves, etc. We describe the technique and include some computer simulations as illustrative examples for x-ray optical component. We show also that this method can be used to study partial or total coherence illumination problem. (C) 2011 Optical Society of America
Keywords:
RESOLUTION
BEAM
LENS

Journal

Optics Express cover
Optics Express
IF:
3.3
Papers:
6.1W
Citations:
14.3W

Organization

R
raja ramanna centre for advanced technology
Scholars:
869
Papers: 810
Citations: 2
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