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SaveFailure mechanisms of GaN HEMTs in single event destructive short-circuit at different VDS voltage levels
Dedew, M. L.; Lefebvre, S.; Nguyen, T. A.; Le, T. L.; Rustichelli, V.; Oliveira, J.; Alam, M.; Fradin, J. P.; Marie, A.; Coccetti, F.
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SaveOn the activation energy in SP-GaN gate HEMT devices during gate lifetime test
Alam, Maroun; Rustichelli, Valeria; Zerarka, Moustafa; Banc, Christophe; Pieprzyk, Jean-Francois; Perrotin, Olivier; Ceccarelli, Romain; Tremouilles, David; Matmat, Mohamed; Coccetti, Fabio
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