Not logged in
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
SaveFailure mechanisms of GaN HEMTs in single event destructive short-circuit at different VDS voltage levels
Dedew, M. L.; Lefebvre, S.; Nguyen, T. A.; Le, T. L.; Rustichelli, V.; Oliveira, J.; Alam, M.; Fradin, J. P.; Marie, A.; Coccetti, F.
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save