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Integrated Dynamic Electron Solutions Inc

Scholars3
Papers2
Citations0
Related Papers (2)
Publication Date
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Automated Data Analysis for Event-Driven Scanning Transmission Electron Microscopy (Tempo-STEM)
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
errOAAI
errBryan W Reed; Daniel J Masiel; Jonathan J P Peters; Lewys Jones
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Statistical Coincidence Suppression for Energy-Dispersive X-Ray Spectroscopy using Pulse Width Modulation
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
PREAI
errBryan W Reed; Daniel J Masiel; Kazuki Yagi; Yuhiro Segawa; Akiho Nakamura; Yuji Konyuba; Kouji Miyatake; Ryuichi Isobe
errShare
errSave