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J
Jeol Ltd
Scholars
37
Papers
16
Citations
0
Related Papers
(12)
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Ultrathin ZSM-5 zeolite nanocrystals synthesized from purely inorganic precursors
Chinese Journal of Catalysis
IF
17.7
2026-09-24
0
PRE
AI
Jiaqi Zhao; Peiyu Shen; Zhengxing Qin; Camille Longue; Nourrdine Chaouati; Ruizhe Zhang; Xiao Chen; Shunsuke Asahin; Natsuko Asano; Gabriel Rueff; Eddy Dib; Hongman Sun; Libin Kang; Jiujiang Wang; Hongjuan Zhao; Honghai Liu; Shutao Xu; Ludovic Pinard; Zifeng Yan; Svetlana Mintova
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Development of the 300 kV Magnetic Field-Free Atomic Resolution Electron Microscope
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Yuji Kohno; Tatsuhiro Maekawa; Shigeyuki Morishita; Hidetaka Sawada; Isamu Ishikawa; Naoya Shibata
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Next-Generation Atomic-Resolution Spectroscopy and Multidimensional Imaging with the Monochromated JEOL ARMD-TEM
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Tobias Heil; Heiko Müller; Stephan Uhlemann; Pirmin Kükelhan; Martin Linck; Hongguang Wang; Akiho Nakamura; Masaki Mukai; Peter A van Aken
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Crystal Orientation Estimation Using Discrete Fourier Transform Analysis of Backscattered Electron Azimuthal Distributions
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Takeshi Otsuka; Seiichi Takami
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Critical Dimension Measurement of ONON Layer Thickness Using OBF STEM: Low-Dose, High-Contrast Imaging
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Masayasu Yoneda; Masahide Shima; Kyoichiro Asayama; Shuji Kawai; Segawa Yuhiro; Kazuya Yamazaki; Kevin Mcilwrath
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Automatic Aberration Correction Using 4D-STEM: Development and Demonstration
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Konosuke Oe; Koudai Tabata; Takehito Seki; Yuji Kohno; Naoya Shibata
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Development and Applications of a High-Speed Spectrum Imaging Method in Auger Electron Spectroscopy
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Fuyuki Nabeshima; Konomi Ikita; Tatsuya Uchida; Noboru Taguchi; Kazushiro Yokouchi; Akihiro Tanaka; Toshiyuki Ohama; Kenichi Tsutsumi
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New Opportunities with the Advent of Monochromated Magnetic-field-free Atomic-resolution Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Jaeyeon Jo; Yohei Tomizawa; James Schultz; Keith Koontz; Tatsuhiro Maekawa; Robert F Klie
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Micro-area Analysis Method for Lithium-ion Battery Reaction Products Using SEM with VUV Spectroscopy and VCA Phase Analysis by EDS
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Yasuaki Yamamoto; Takanori Murano; Shogo Koshiya; Kentaro Kato; Mayu Morimoto; Yasuhito Aoki
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Comparison of Analytical Sensitivities of Simultaneously Acquired EELS and XEDS Signals from Same Ionization Processes
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Masashi Watanabe; Alexander Campos-Quiros; Giulio Guzzinati; Pirmin Kükelhan; Volker Gerheim; Martin Linck; Heiko Müller; Max Haider; Thomas F Hoffman; Kotaro Sakaguchi; Masaki Mukai; Takeshi Kaneko; Naoki Shimura; Shintaro Hirata; Akiho Nakamura; Masashi Nishikawa; Thomas Isabell; Hidetaka Sawada
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Developments of a Large-Convergence-Angle Scanning Transmission Electron Microscope Operable Over a Wide Range of Accelerating Voltages
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Gen Koinuma; Yuki Ninota; Philipp Wachsmuth; Naoya Chihara; Yu Jimbo; Svenja Perl; Thomas Riedel; Stephan Uhlemann
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Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography
Micron
IF
2.2
2026-07-01
0
PRE
AI
Malac, Marek; Harada, Ken; Yaguchi, Toshie; Taniguchi, Yoshifumi; Yamasaki, Jun; Howe, Jane; Blackburn, Arthur; Motoki, Sohei; Konyuba, Yuji
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