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Gatan Inc

Scholars36
Papers13
Citations0
Related Papers (12)
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Fast HR-EBSD Based Pattern Center Calibration
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errWilliam C Lenthe; Stuart I Wright; Matthew M Nowell; Rene de Kloe
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New Scan Strategies for Spectrum Image Acquisition of Dose-Constrained Materials.
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errAndrew Thron; Liam Spillane; Paul Thomas; Bernhard Schaffer; Ray Twesten
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Improving the Accessibility and Performance of Deformation, Defect, and Strain Analysis with Electron Backscatter Diffraction (EBSD)
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errMatthew M Nowell; William C Lenthe; Stuart I Wright; Rene de Kloe
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Enhanced Multimodal Workflow Capabilities with EELS and Precession-Assisted 4D STEM
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errFernando C Castro; Andrew Thron; Liam Spillane
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Multimodal STEM Analysis of Semiconductor Devices at Low kV: Dose-Efficient Wide-Range EELS and 4D STEM at Extended Camera Length
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errLiam Spillane; Andrew Thron; Fernando Castro; Ray D Twesten
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errSave
Local Glass Composition and Microstructure Mitigate PID Failure in Silicon Solar Cells: A Multimodal In-Situ Biasing Study
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errSteven C Hayden; Caleb Okrucky; Andrew Thron; John Mangum; Ashley Gaulding; Patrick Walker; Katherine Jungjohann
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Micro-XRF Characterization of SEM Coatings Deposited by a Broad Argon Ion Beam Tool
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errShangshang Mu; Gerward Weppelman; Cecilia Xu; Steve Coyle; Chris Booth
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SEM Study of Lithium-Containing Microstructures for Battery and Biomedical Technologies
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errShangshang Mu; Julia Mausz; David Stowe
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From Low-dose to High-kV: a Large Area Windowless SEM–EDS Approach for Real-world Materials Analysis
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errDavid Stowe; Julia Mausz; Sophie Yan; Jens Rafaelsen
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Closing the Feedback Loop: Live Polarization Analysis for Automated In Situ 4D-STEM and SEM
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errFintan Hardy; Noah Schnitzer; Mariana Palos; Liam Spillane; Aron Walsh; Michele Conroy
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High-Precision Micro-XRF for Forensic Glass Comparison: A Study of Cross-Generation Consistency and Efficiency
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errShangshang Mu; Gerward Weppelman; Aurélien Moy; Steve Coyle; Ed James; Jacob Wilbrink; Chris Booth
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Optimized Electrostatic Beam Blanking for Dose-Controlled Liquid Phase In-Situ STEM: Imaging, EELS, and 4D-STEM of Au Nanoparticle Growth Dynamics
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errLiam Spillane; Mervan Ramadan; Cheng Sun; Marc-Georg Willinger
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