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Ametek Bv Edax
Scholars
3
Papers
2
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0
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Fast HR-EBSD Based Pattern Center Calibration
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
William C Lenthe; Stuart I Wright; Matthew M Nowell; Rene de Kloe
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Improving the Accessibility and Performance of Deformation, Defect, and Strain Analysis with Electron Backscatter Diffraction (EBSD)
Microscopy and Microanalysis
IF
3
2026-07-27
0
OA
AI
Matthew M Nowell; William C Lenthe; Stuart I Wright; Rene de Kloe
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