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Department of Electromagnetism And Electronics

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Electron and Ion Dynamics in Reconnection Diffusion Regions
err2025-08-11
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errOAAI
errC. Norgren; L.-J. Chen; D. B. Graham; N. Bessho; J. Egedal; L. Richard; Yu. V. Khotyaintsev; J. Shuster; S. Toledo-Redondo; B. Lavraud; H. Hasegawa; J. P. Eastwood; M. Hesse; Y.-H. Liu; J. C. Holmes; M. Argall
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