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Impact of ambient temperature on the switching of voltage-controlled perpendicular magnetic tunnel junction Wu, Y. C.; Kim, W.; Van Beek, S.; Couet, S.; Carpenter, R.; Rao, S.; Kundu, S.; Van Houdt, J.; Groeseneken, G.; Crotti, D.; Kar, G. S. Share Save
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Ferroelectric Control of Magnetism in Ultrathin HfO2\Co\Pt Layers Vermeulen, Bart F.; Ciubotaru, Florin; Popovici, Mihaela I.; Swerts, Johan; Couet, Sebastien; Radu, Iuliana P.; Stancu, Alexandru; Temst, Kristiaan; Groeseneken, Guido; Adelmann, Christoph; Martens, Koen M. Share Save
Impact of operating temperature on the electrical and magnetic properties of the bottom-pinned perpendicular magnetic tunnel junctions Wu, Y. C.; Kim, W.; Rao, S.; Garello, K.; Van Beek, S.; Couet, S.; Liu, E.; Swerts, J.; Kundu, S.; Souriau, L.; Yasin, F.; Crotti, D.; Jochum, J. K.; Van Bael, M. J.; Van Houdt, J.; Groeseneken, G.; Kar, G. S. Share Save
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Correlation of interface states/border traps and threshold voltage shift on AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors Wu, Tian-Li; Marcon, Denis; Bakeroot, Benoit; De Jaeger, Brice; Lin, H. C.; Franco, Jacopo; Stoffels, Steve; Van Hove, Marleen; Roelofs, Robin; Groeseneken, Guido; Decoutere, Stefaan Share Save
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Photoresistance Switching of Plasmonic Nanopores Li, Yi; Nicoli, Francesca; Chen, Chang; Lagae, Liesbet; Groeseneken, Guido; Stakenborg, Tim; Zandbergen, Henny W.; Dekker, Cees; Van Dorpe, Pol; Jonsson, Magnus P. Share Save
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Sidewall Crystalline Orientation Effect of Post-treatments for a Replacement Metal Gate Bulk Fin Field Effect Transistor Lee, Jae Woo; Simoen, Eddy; Veloso, Anabela; Cho, Moon Ju; Boccardi, Guillaume; Ragnarsson, Lars-Ake; Chiarella, Thomas; Horiguchi, Naoto; Groeseneken, Guido; Thean, Aaron Share Save
Plasma doping and reduced crystalline damage for conformally doped fin field effect transistors Lee, Jae Woo; Sasaki, Yuichiro; Cho, Moon Ju; Togo, Mitsuhiro; Boccardi, Guillaume; Ritzenthaler, Romain; Eneman, Geert; Chiarella, Thomas; Brus, Stephan; Horiguchi, Naoto; Groeseneken, Guido; Thean, Aaron Share Save
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1/f noise analysis of replacement metal gate bulk p-type fin field effect transistor Lee, Jae Woo; Cho, Moon Ju; Simoen, Eddy; Ritzenthaler, Romain; Togo, Mitsuhiro; Boccardi, Guillaume; Mitard, Jerome; Ragnarsson, Lars-Ake; Chiarella, Thomas; Veloso, Anabela; Horiguchi, Naoto; Thean, Aaron; Groeseneken, Guido Share Save