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Seck, Daouda

universite polytechnique hauts-de-france

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Development of LRRM and TRL Calibration Kits for On-Wafer Microwave Measurements at the Nanoscale
err2024 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION, NEMO
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err2026-01-01
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errSeck, Daouda; Allal, Djamel; Haddadi, Kamel
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Allal, Djamel
H-index: 0 · Papers: 1
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Haddadi, Kamel
H-index: 0 · Papers: 2
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