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H
Heesun Yun
Affiliation pending
2
H-index
4
Paper Count
31
Citation Count
0
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Published Papers
1
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Citations
Fuzzability Testing Framework for Incomplete Firmware Binary
IEEE ACCESS
IF
3.6
2023-01-01
1
OA
AI
Jang, Jiwon; Son, Gyeongjin; Lee, Hyeonsu; Yun, Heesun; Kim, Deokjin; Lee, Sangwook; Kim, Seongmin; Jang, Daehee
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Co-authors
Cooperation Journals
S
Sangwook Lee
H-index: 25 · Papers: 210
S
Seongmin Kim
H-index: 12 · Papers: 81
H
Hyeonsu Lee
H-index: 5 · Papers: 14
D
Daehee Jang
H-index: 2 · Papers: 5
D
Deokjin Kim
H-index: 2 · Papers: 11
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