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Yunzhan Gong

beijing university of posts & telecommunications

11H-index
131Paper Count
460Citation Count
Published Papers 9
Publication Date
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A Reinforcement Learning-Based Approach for Determining Infeasible Paths of Programs
errINTERNATIONAL JOURNAL OF SOFTWARE ENGINEERING AND KNOWLEDGE ENGINEERING
IF0.6
err2025-09-01
err0
PREAI
errDai, Peng; He, Tang; Peng, Zebo; Zhao, Chen; Gong, Yunzhan
errShare
errSave
Towards Failure-Aware Inference in Harsh Operating Conditions: Robust Mobile Offloading of Pre-Trained Neural Networks
errELECTRONICS
IF2.6
err2025-01-19
err0
errOAAI
errLiu, Wenjing; Chen, Zhongmin; Gong, Yunzhan
errShare
errSave
Efficient fine-tuned preventive monitoring models of bearing failures without prior on-site fault data
errMEASUREMENT
IF5.6
err2025-01-01
err0
PREAI
errLiu, Wenjing; Xu, Zhiwei; Wang, Jing; Tian, Jie; Jin, Dahai; Gong, Yunzhan
errShare
errSave
ST-TLF: Cross-version defect prediction framework based transfer learning
errINFORMATION AND SOFTWARE TECHNOLOGY
IF4.3
err2022-09-01
err12
PREAI
errZhao, Yanyang; Wang, Yawen; Zhang, Yuwei; Zhang, Dalin; Gong, Yunzhan; Jin, Dahai
errShare
errSave
Eliminating the high false-positive rate in defect prediction through BayesNet with adjustable weight
errEXPERT SYSTEMS
IF2.3
err2022-03-04
err7
errOAAI
errZhao, Yanyang; Wang, Yawen; Zhang, Dalin; Gong, Yunzhan
errShare
errSave
Automated defect identification via path analysis-based features with transfer learning
errJOURNAL OF SYSTEMS AND SOFTWARE
IF4.1
err2020-08-01
err19
errOAAI
errZhang, Yuwei; Jin, Dahai; Xing, Ying; Gong, Yunzhan
errShare
errSave
A variable-level automated defect identification model based on machine learning
errSOFT COMPUTING
IF2.5
err2019-03-23
err18
errOAAI
errZhang, Yuwei; Xing, Ying; Gong, Yunzhan; Jin, Dahai; Li, Honghui; Liu, Feng
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errSave
Detecting Interprocedural Infeasible Paths Based on Unsatisfiable Path Constraint Patterns
errIEEE ACCESS
IF3.6
err2019-01-01
err4
errOAAI
errZhu, Honglei; Jin, Dahai; Gong, Yunzhan; Xing, Ying; Zhou, Mingnan
errShare
errSave
Domain-RIP Analysis: A Technique for Analyzing Mutation Stubbornness
errIEEE ACCESS
IF3.6
err2019-01-01
err1
errOAAI
errLin, Huan; Wang, Yawen; Gong, Yunzhan; Jin, Dahai
errShare
errSave

Research Directions

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Co-authors
Cooperation Journals
王
王竞 (Jing Wang)
H-index: 61 · Papers: 488
Z
Zebo Peng
H-index: 46 · Papers: 502
李
李虹辉 (Honghui Li)
H-index: 33 · Papers: 403
Z
Zhiwei Xu
H-index: 23 · Papers: 66
J
Jie Tian
H-index: 19 · Papers: 118
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