Not logged inEvaluation of a modified void descriptor function to uniquely characterize pore networks and predict fracture-related properties in additively manufactured metals (vol 223, 117464, 2022)
Watring, Dillon S.; Benzing, Jake T.; Kafka, Orion L.; Liew, Li-Anne; Moser, Newell H.; Erickson, John; Hrabe, Nikolas; Spear, Ashley D.
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SaveChip-scale atomic devices at NIST
Knappe, Svenja; Schwindt, Peter; Gerginov, Vladislav; Shah, Vishal; Brannon, Alan; Lindseth, Brad; Liew, Li-Anne; Robinson, Hugh; Moreland, John; Popovic, Zoya; Hollberg, Leo; Kitching, John
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