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C.H. Diaz

taiwan semiconductor manufacturing company

34H-index
172Paper Count
3.3KCitation Count
Published Papers 6
Publication Date
Roadmap on low-power electronics
err2024-09-17
err3
errOAAI
errRamesh, Ramamoorthy; Salahuddin, Sayeef; Datta, Suman; Diaz, Carlos H.; Nikonov, Dmitri E.; Young, Ian A.; Ham, Donhee; Chang, Meng-Fan; Khwa, Win-San; Lele, Ashwin Sanjay; Binek, Christian; Huang, Yen-Lin; Sun, Yuan-Chen; Chu, Ying-Hao; Prasad, Bhagwati; Hoffmann, Michael; Hu, Jia-Mian; Yao, Zhi (Jackie); Bellaiche, Laurent; Wu, Peng; Cai, Jun; Appenzeller, Joerg; Datta, Supriyo; Camsari, Kerem Y.; Kwon, Jaesuk; Incorvia, Jean Anne C.; Asselberghs, Inge; Ciubotaru, Florin; Couet, Sebastien; Adelmann, Christoph; Zheng, Yi; Lindenberg, Aaron M.; Evans, Paul G.; Ercius, Peter; Radu, Iuliana P.
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Formation of multiple dislocations in Si solid-phase epitaxy regrowth process using stress memorization technique
err2015-06-01
err2
PREAI
errShen, T. M.; Wang, S. J.; Tung, Y. T.; Hwang, R. L.; Wu, C. C.; Wu, Jeff; Diaz, Carlos H.
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Lifting the off-state bandgap limit in InAs channel metal-oxide-semiconductor heterostructures of nanometer dimensions
err2014-06-02
err9
PREAI
errPasslack, Matthias; Wang, Shih-Wei; Doornbos, Gerben; Wang, Chien-Hsun; Contreras-Guerrero, Rocio; Edirisooriya, Madhavie; Rojas-Ramirez, Juan; Hsieh, Chih-Hua; Droopad, Ravi; Diaz, Carlos H.
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InAs hole inversion and bandgap interface state density of 2 x 1011 cm-2 eV-1 at HfO2/InAs interfaces
err2013-10-04
err34
PREAI
errWang, C. H.; Wang, S. W.; Doornbos, G.; Astromskas, G.; Bhuwalka, K.; Contreras-Guerrero, R.; Edirisooriya, M.; Rojas-Ramirez, J. S.; Vellianitis, G.; Oxland, R.; Holland, M. C.; Hsieh, C. H.; Ramvall, P.; Lind, E.; Hsu, W. C.; Wernersson, L-E; Droopad, R.; Passlack, M.; Diaz, C. H.
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Mobility and screening effect in heavily doped accumulation-mode metal-oxide-semiconductor field-effect transistors
err2012-08-14
err49
PREAI
errGoto, Ken-Ichi; Yu, Tsung-Hsing; Wu, Jeff; Diaz, Carlos H.; Colinge, J. P.
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Series Resistance and Mobility Extraction Method in Nanoscale MOSFETs
err2009-01-01
err8
PREAI
errChen, William Po-Nien; Su, Pin; Goto, Ken-Ichi; Diaz, Carlos H.
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