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H

H. Bender

russian academy of sciences

51H-index
687Paper Count
1.1WCitation Count
Published Papers 89
Publication Date
Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopy
err2021-10-08
err4
errOAAI
errPrabhakara, V; Nuytten, T.; Bender, H.; Vandervorst, W.; Bals, S.; Verbeeck, J.
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Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges
err2020-08-11
err17
errOAAI
errCelano, Umberto; Gomez, Andres; Piedimonte, Paola; Neumayer, Sabine; Collins, Liam; Popovici, Mihaela; Florent, Karine; McMitchell, Sean R. C.; Favia, Paola; Drijbooms, Chris; Bender, Hugo; Paredis, Kristof; Di Piazza, Luca; Jesse, Stephen; Van Houdt, Jan; van der Heide, Paul
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Grain-Boundary-Induced Strain and Distortion in Epitaxial Bilayer MoS2 Lattice
err2020-02-21
err21
errOAAI
errMehta, Ankit Nalin; Mo, Jiongjiong; Pourtois, Geoffrey; Dabral, Ashish; Groven, Benjamin; Bender, Hugo; Favia, Paola; Caymax, Matty; Vandervorst, Wilfried
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Atomic-scale investigations on the wet etching kinetics of Ge versus SiGe in acidic H2O2 solutions: a post operando synchrotron XPS analysis
err2020-01-01
err7
PREAI
errAbrenica, Graniel Harne A.; Lebedev, Mikhail, V; Fingerle, Mathias; Arnauts, Sophia; Bazzazian, Nazaninsadat; Calvet, Wolfram; Porret, Clement; Bender, Hugo; Mayer, Thomas; de Gendt, Stefan; van Dorp, Dennis H.
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Improvement of high temperature water rinsing and drying for HF-last wafer cleaning
err2019-12-07
err17
PREAI
errLi, L; Bender, H; Zou, G; Mertens, PW; Meuris, MA; Heyns, MM
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Protrusion formation at the edges of ion implanted regions
err2019-12-06
err0
PREAI
errRotondaro, ALP; Bender, H; Heyns, MM; Claeys, C
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Ion-induced amorphization and regrowth of C49 and C54 TiSi2
err2019-12-06
err2
PREAI
errMohadjeri, B; Maex, K; Donaton, RA; Bender, H
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Metal barrier induced damage in self-assembly based organosilica low-k dielectrics and its reduction by organic template residues
err2019-08-01
err9
PREAI
errKrishtab, M.; De Marneffe, J-F; Armini, S.; Meersschaut, J.; Benders, H.; Wilson, C.; De Gendt, S.
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Chemical vapor deposition of monolayer-thin WS2 crystals from the WF6 and H2S precursors at low deposition temperature
err2019-03-11
err13
errOAAI
errGroven, B.; Claes, D.; Mehta, A. Nalin; Bender, H.; Vandervorst, W.; Heyns, M.; Caymax, M.; Radu, I.; Delabie, A.
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Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si
err2018-11-07
err0
PREAI
errGupta, S.; Shimura, Y.; Richard, O.; Douhard, B.; Simoen, E.; Bender, H.; Nakatsuka, O.; Zaima, S.; Loo, R.; Heyns, M.
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Two-Dimensional Crystal Grain Size Tuning in WS2 Atomic Layer Deposition: An Insight in the Nucleation Mechanism
err2018-09-17
err65
errOAAI
errGroven, Benjamin; Mehta, Ankit Nalin; Bender, Hugo; Meersschaut, Johan; Nuytten, Thomas; Verdonck, Patrick; Conard, Thierry; Smets, Quentin; Schram, Tom; Schoenaers, Ben; Stesmans, Andre; Afanas'ev, Valeri; Vandervorst, Wilfried; Heyns, Marc; Caymax, Matty; Radu, Iuliana; Delabie, Annelies
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Electrical properties of extended defects in strain relaxed GeSn
err2018-07-09
err22
errOAAI
errGupta, Somya; Simoen, Eddy; Loo, Roger; Shimura, Yosuke; Porret, Clement; Gencarelli, Federica; Paredis, Kristof; Bender, Hugo; Lauwaert, Johan; Vrielinck, Henk; Heyns, Marc
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Voltage-controlled reverse filament growth boosts resistive switching memory
err2018-02-02
err24
PREAI
errBelmonte, Attilio; Celano, Umberto; Chen, Zhe; Radhaskrishnan, Janaki; Redolfi, Augusto; Clima, Sergiu; Richard, Olivier; Bender, Hugo; Kar, Gouri Sankar; Vandervorst, Wilfried; Goux, Ludovic
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Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy
err2018-01-10
err13
errOAAI
errNuytten, T.; Bogdanowicz, J.; Witters, L.; Eneman, G.; Hantschel, T.; Schulze, A.; Favia, P.; Bender, H.; De Wolf, I.; Vandervorst, W.
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The flexoelectric effect in Al-doped hafnium oxide
err2018-01-01
err24
PREAI
errCelano, Umberto; Popovici, Mihaela; Florent, Karine; Lavizzari, Simone; Favia, Paola; Paulussen, Kris; Bender, Hugo; di Piazza, Luca; Van Houdt, Jan; Vandervorst, Wilfried
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Correlation between surface reconstruction and polytypism in InAs nanowire selective area epitaxy
err2017-12-26
err16
PREAI
errLiu, Ziyang; Merckling, Clement; Rooyackers, Rita; Richard, Olivier; Bender, Hugo; Mols, Yves; Vila, Maria; Rubio-Zuazo, Juan; Castro, German R.; Collaert, Nadine; Thean, Aaron; Vandervorst, Wilfried; Heyns, Marc
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MoS2 Functionalization with a Sub-nm Thin SiO2 Layer for Atomic Layer Deposition of High-κ Dielectrics
err2017-07-28
err34
PREAI
errZhang, Haodong; Arutchelvan, Goutham; Meersschaut, Johan; Gaur, Abhinav; Conard, Thierry; Bender, Hugo; Lin, Dennis; Asselberghs, Inge; Heyns, Marc; Radu, Iuliana; Vandervorst, Wilfried; Delabie, Annelies
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Atomic Layer Deposition of Ruthenium Thin Films from (Ethylbenzyl) (1-Ethyl-1,4-cyclohexadienyl) Ru: Process Characteristics, Surface Chemistry, and Film Properties
err2017-05-31
err48
PREAI
errPopovici, Mihaela; Groven, Benjamin; Marcoen, Kristof; Quan Manh Phung; Dutta, Shibesh; Swerts, Johan; Meersschaut, Johan; van den Berg, Jaap A.; Franquet, Alexis; Moussa, Alain; Vanstreels, Kris; Lagrain, Pieter; Bender, Hugo; Jurczak, Malgorzata; Van Elshocht, Sven; Delabie, Annelies; Adelmann, Christoph
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Plasma-Enhanced Atomic Layer Deposition of Two-Dimensional WS2 from WF6, H2 Plasma, and H2S
err2017-03-16
err76
errOAAI
errGroven, Benjamin; Heyne, Markus; Mehta, Ankit Nalin; Bender, Hugo; Nuytten, Thomas; Meersschaut, Johan; Conard, Thierry; Verdonck, Patrick; Van Elshocht, Sven; Vandervorst, Wilfried; De Gendt, Stefan; Heyns, Marc; Radu, Iuliana; Caymax, Matty; Delabie, Annelies
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Advanced Raman Spectroscopy Using Nanofocusing of Light
err2017-01-13
err12
PREAI
errNuytten, Thomas; Bogdanowicz, Janusz; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried
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