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Daniel Sawyer

national institute of standards & technology (nist) - usa

16H-index
117Paper Count
988Citation Count
Published Papers 13
Publication Date
errSENSORS
IF3.5
err2024-05-07
err2
errOAAI
errMuralikrishnan, Bala; Czapla, Braden; Lee, Vincent; Shakarji, Craig; Sawyer, Daniel; Saure, Matthias
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err2020-12-01
err17
PREAI
errWang, Ling; Muralikrishnan, Bala; Icasio Hernandez, Octavio; Shakarji, Craig; Sawyer, Daniel
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err2020-11-01
err12
errOAAI
errShi, Shendong; Muralikrishnan, Bala; Sawyer, Daniel
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err2020-07-01
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PREAI
errShi, Shendong; Muralikrishnan, Bala; Lee, Vincent; Sawyer, Daniel
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err2020-03-01
err4
PREAI
errWang, Ling; Muralikrishnan, Bala; Lee, Vincent; Rachakonda, Prem; Sawyer, Daniel; Gleason, Joe
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err2020-02-01
err5
PREAI
errWang, Ling; Muralikrishnan, Bala; Lee, Vincent; Rachakonda, Prem; Sawyer, Daniel; Gleason, Joe
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err2019-02-01
err7
errOAAI
errRachakonda, Prem; Muralikrishnan, Bala; Sawyer, Daniel
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err2018-04-01
err8
errOAAI
errMuralikrishnan, Bala; Wang, Ling; Rachakonda, Prem; Sawyer, Daniel
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err2017-12-01
err16
errOAAI
errMuralikrishnan, Bala; Rachakonda, Prem; Lee, Vincent; Shilling, Meghan; Sawyer, Daniel; Cheok, Geraldine; Cournoyer, Luc
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err2016-04-01
err204
PREAI
errMuralikrishnan, Bala; Phillips, Steve; Sawyer, Daniel
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err2015-10-01
err10
PREAI
errMuralikrishnan, Bala; Shilling, Meghan; Rachakonda, Prem; Ren, Wei; Lee, Vincent; Sawyer, Daniel
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err2015-04-01
err50
PREAI
errMuralikrishnan, B.; Ferrucci, M.; Sawyer, D.; Gerner, G.; Lee, V.; Blackburn, C.; Phillips, S.; Petrov, P.; Yakovlev, Y.; Astrelin, A.; Milligan, S.; Palmateer, J.
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err2001-01-01
err14
PREAI
errPhillips, SD; Sawyer, D; Borchardt, B; Ward, D; Beutel, DE
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