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SaveInvestigation of Failure Mechanisms of 1200 V Rated Trench SiC MOSFETs Under Repetitive Avalanche Stress
Deng, Xiaochuan; Huang, Wei; Li, Xu; Li, Xuan; Chen, Chao; Wen, Yi; Ding, Jiawei; Chen, Wanjun; Sun, Yongkui; Zhang, Bo Share Save Short-Circuit Capability Prediction and Failure Mode of Asymmetric and Double Trench SiC MOSFETsDeng, Xiaochuan; Li, Xu; Li, Xuan; Zhu, Hao; Xu, Xiaojie; Wen, Yi; Sun, Yongkui; Chen, Wanjun; Li, Zhiqiang; Zhang, Bo Share Save Share Save Share Save Share Save Share Save 
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