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SaveImpact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights
Zhu, Yaxing; Zhao, Dongyan; Dai, Fei; Chen, Yanning; Liu, Fang; Wu, Bo; Zhao, Yang; Ren, Bocong; Wang, Yanhong; Liang, Yingzong; Wang, Junpeng
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