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Paula Heu

cnrs - national institute of nuclear and particle physics (in2p3)

15H-index
66Paper Count
1.4KCitation Count
Published Papers 9
Publication Date
Thermalization and criticality on an analogue-digital quantum simulator
errNATURE
IF48.5
err2025-02-05
err4
errOAAI
errAndersen, T. I.; Astrakhantsev, N.; Karamlou, A. H.; Berndtsson, J.; Motruk, J.; Szasz, A.; Gross, J. A.; Schuckert, A.; Westerhout, T.; Zhang, Y.; Forati, E.; Rossi, D.; Kobrin, B.; Di Paolo, A.; Klots, A. R.; Drozdov, I.; Kurilovich, V.; Petukhov, A.; Ioffe, L. B.; Elben, A.; Rath, A.; Vitale, V.; Vermersch, B.; Acharya, R.; Beni, L. A.; Anderson, K.; Ansmann, M.; Arute, F.; Arya, K.; Asfaw, A.; Atalaya, J.; Ballard, B.; Bardin, J. C.; Bengtsson, A.; Bilmes, A.; Bortoli, G.; Bourassa, A.; Bovaird, J.; Brill, L.; Broughton, M.; Browne, D. A.; Buchea, B.; Buckley, B. B.; Buell, D. A.; Burger, T.; Burkett, B.; Bushnell, N.; Cabrera, A.; Campero, J.; Chang, H. -S.; Chen, Z.; Chiaro, B.; Claes, J.; Cleland, Y.; Cogan, J.; Collins, R.; Conner, P.; Courtney, W.; Crook, A. L.; Das, S.; Debroy, D. M.; De Lorenzo, L.; Barba, A. Del Toro; Demura, S.; Donohoe, P.; Dunsworth, A.; Earle, C.; Eickbusch, A.; Elbag, A. M.; Elzouka, M.; Erickson, C.; Faoro, L.; Fatemi, R.; Ferreira, V. S.; Burgos, L. Flores; Fowler, A. G.; Foxen, B.; Ganjam, S.; Gasca, R.; Giang, W.; Gidney, C.; Gilboa, D.; Giustina, M.; Gosula, R.; Dau, A. Grajales; Graumann, D.; Greene, A.; Habegger, S.; Hamilton, M. C.; Hansen, M.; Harrigan, M. P.; Harrington, S. D.; Heslin, S.; Heu, P.; Hill, G.; Hoffmann, M. R.; Huang, H. -Y.; Huang, T.; Huff, A.; Huggins, W. J.; Isakov, S. V.; Jeffrey, E.; Jiang, Z.; Jones, C.; Jordan, S.; Joshi, C.; Juhas, P.; Kafri, D.; Kang, H.; Kechedzhi, K.; Khaire, T.; Khattar, T.; Khezri, M.; Kieferova, M.; Kim, S.; Kitaev, A.; Klimov, P.; Korotkov, A. N.; Kostritsa, F.; Kreikebaum, J. M.; Landhuis, D.; Langley, B. W.; Laptev, P.; Lau, K. -M.; Le Guevel, L.; Ledford, J.; Lee, J.; Lee, K. W.; Lensky, Y. D.; Lester, B. J.; Li, W. Y.; Lill, A. T.; Liu, W.; Livingston, W. P.; Locharla, A.; Lundahl, D.; Lunt, A.; Madhuk, S.; Maloney, A.; Mandra, S.; Martin, L. S.; Martin, O.; Martin, S.; Maxfield, C.; McClean, J. R.; McEwen, M.; Meeks, S.; Miao, K. C.; Mieszala, A.; Molina, S.; Montazeri, S.; Morvan, A.; Movassagh, R.; Neill, C.; Nersisyan, A.; Newman, M.; Nguyen, A.; Nguyen, M.; Ni, C. -H.; Niu, M. Y.; Oliver, W. D.; Ottosson, K.; Pizzuto, A.; Potter, R.; Pritchard, O.; Pryadko, L. P.; Quintana, C.; Reagor, M. J.; Rhodes, D. M.; Roberts, G.; Rocque, C.; Rosenberg, E.; Rubin, N. C.; Saei, N.; Sankaragomathi, K.; Satzinger, K. J.; Schurkus, H. F.; Schuster, C.; Shearn, M. J.; Shorter, A.; Shutty, N.; Shvarts, V.; Sivak, V.; Skruzny, J.; Small, S.; Smith, W. Clarke; Springer, S.; Sterling, G.; Suchard, J.; Szalay, M.; Sztein, A.; Thor, D.; Torres, A.; Torunbalci, M. M.; Vaishnav, A.; Vdovichev, S.; Villalonga, B.; Heidweiller, C. Vollgraff; Waltman, S.; Wang, S. X.; White, T.; Wong, K.; Woo, B. W. K.; Xing, C.; Yao, Z. Jamie; Yeh, P.; Ying, B.; Yoo, J.; Yosri, N.; Young, G.; Zalcman, A.; Zhu, N.; Zobrist, N.; Neven, H.; Babbush, R.; Boixo, S.; Hilton, J.; Lucero, E.; Megrant, A.; Kelly, J.; Chen, Y.; Smelyanskiy, V.; Vidal, G.; Roushan, P.; Lauchli, A. M.; Abanin, D. A.; Mi, X.
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Mid-infrared interference coatings with excess optical loss below 10 ppm (vol 8, pg 686, 2021)
errOPTICA
IF8.5
err2024-04-25
err0
errOAAI
errPerner, L. W.; Winkler, G.; Truong, G. -W.; Zhao, G.; Bachmann, D.; Mayer, A. S.; Fellinger, J.; Follman, D.; Heu, P.; Deutsch, C.; Bailey, D. M.; Peelaers, H.; Puchegger, S.; Fleisher, A. J.; Cole, G. D.; Heckl, O. H.
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errSave
Overcoming leakage in quantum error correction
err2023-10-05
err10
errOAAI
errMiao, Kevin C.; McEwen, Matt; Atalaya, Juan; Kafri, Dvir; Pryadko, Leonid P.; Bengtsson, Andreas; Opremcak, Alex; Satzinger, Kevin J.; Chen, Zijun; Klimov, Paul V.; Quintana, Chris; Acharya, Rajeev; Anderson, Kyle; Ansmann, Markus; Arute, Frank; Arya, Kunal; Asfaw, Abraham; Bardin, Joseph C.; Bourassa, Alexandre; Bovaird, Jenna; Brill, Leon; Buckley, Bob B.; Buell, David A.; Burger, Tim; Burkett, Brian; Bushnell, Nicholas; Campero, Juan; Chiaro, Ben; Collins, Roberto; Conner, Paul; Crook, Alexander L.; Curtin, Ben; Debroy, Dripto M.; Demura, Sean; Dunsworth, Andrew; Erickson, Catherine; Fatemi, Reza; Ferreira, Vinicius S.; Burgos, Leslie Flores; Forati, Ebrahim; Fowler, Austin G.; Foxen, Brooks; Garcia, Gonzalo; Giang, William; Gidney, Craig; Giustina, Marissa; Gosula, Raja; Dau, Alejandro Grajales; Gross, Jonathan A.; Hamilton, Michael C.; Harrington, Sean D.; Heu, Paula; Hilton, Jeremy; Hoffmann, Markus R.; Hong, Sabrina; Huang, Trent; Huff, Ashley; Iveland, Justin; Jeffrey, Evan; Jiang, Zhang; Jones, Cody; Kelly, Julian; Kim, Seon; Kostritsa, Fedor; Kreikebaum, John Mark; Landhuis, David; Laptev, Pavel; Laws, Lily; Lee, Kenny; Lester, Brian J.; Lill, Alexander T.; Liu, Wayne; Locharla, Aditya; Lucero, Erik; Martin, Steven; Megrant, Anthony; Mi, Xiao; Montazeri, Shirin; Morvan, Alexis; Naaman, Ofer; Neeley, Matthew; Neill, Charles; Nersisyan, Ani; Newman, Michael; Ng, Jiun How; Nguyen, Anthony; Nguyen, Murray; Potter, Rebecca; Rocque, Charles; Roushan, Pedram; Sankaragomathi, Kannan; Schurkus, Henry F.; Schuster, Christopher; Shearn, Michael J.; Shorter, Aaron; Shutty, Noah; Shvarts, Vladimir; Skruzny, Jindra; Smith, W. Clarke; Sterling, George; Szalay, Marco; Thor, Douglas; Torres, Alfredo; White, Theodore; Woo, Bryan W. K.; Yao, Z. Jamie; Yeh, Ping; Yoo, Juhwan; Young, Grayson; Zalcman, Adam; Zhu, Ningfeng; Zobrist, Nicholas; Neven, Hartmut; Smelyanskiy, Vadim; Petukhov, Andre; Korotkov, Alexander N.; Sank, Daniel; Chen, Yu
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Mid-infrared interference coatings with excess optical loss below 10 ppm
errOPTICA
IF8.5
err2021-05-14
err28
errOAAI
errWinkler, G.; Perner, L. W.; Truong, G-W; Zhao, G.; Bachmann, D.; Mayer, A. S.; Fellinger, J.; Follman, D.; Heu, P.; Deutsch, C.; Bailey, D. M.; Peelaers, H.; Puchegger, S.; Fleisher, A. J.; Cole, G. D.; Heckl, O. H.
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Room-temperature optomechanical squeezing
err2020-07-07
err57
errOAAI
errAggarwal, Nancy; Cullen, Torrey J.; Cripe, Jonathan; Cole, Garrett D.; Lanza, Robert; Libson, Adam; Follman, David; Heu, Paula; Corbitt, Thomas; Mavalvala, Nergis
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Thickness uniformity measurements and damage threshold tests of large-area GaAs/AIGaAs crystalline coatings for precision interferometry
err2019-12-04
err15
errOAAI
errKoch, P.; Cole, G. D.; Deutsch, C.; Follman, D.; Heu, P.; Kinley-Hanlon, M.; Kirchhoff, R.; Leavey, S.; Lehmann, J.; Oppermann, P.; Rai, A. K.; Tornasi, Z.; Woehler, J.; Wu, D. S.; Zederbauer, T.; Lueck, H.
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Broadband reduction of quantum radiation pressure noise via squeezed light injection
err2019-10-07
err41
PREAI
errYap, Min Jet; Cripe, Jonathan; Mansell, Georgia L.; McRae, Terry G.; Ward, Robert L.; Slagmolen, Bram J. J.; Heu, Paula; Follman, David; Cole, Garrett D.; Corbitt, Thomas; McClelland, David E.
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Optical performance of large-area crystalline coatings
err2018-02-28
err14
errOAAI
errMarchio, Manuel; Flaminio, Raffaele; Pinard, Laurent; Forest, Daniele; Deutsch, Christoph; Heu, Paula; Follman, David; Cole, Garrett D.
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errSave
High-performance near- and mid-infrared crystalline coatings
errOPTICA
IF8.5
err2016-06-13
err128
errOAAI
errCole, Garrett D.; Zhang, Wei; Bjork, Bryce J.; Follman, David; Heu, Paula; Deutsch, Christoph; Sonderhouse, Lindsay; Robinson, John; Franz, Chris; Alexandrovski, Alexei; Notcutt, Mark; Heckl, Oliver H.; Ye, Jun; Aspelmeyer, Markus
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errSave