Vincent S. Smentkowski - Publications, H-index & Citations

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Vincent S. Smentkowski

General Electric

24H-index

106Paper Count

1.8KCitation Count

Published Papers 11

Publication Date

Elemental imaging

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

IF3.1

2013-01-01

PREAI

Pisonero, J.; Bordel, N.; Smentkowski, V. S.

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Effect of Surface Free Energy on PDMS Transfer in Microcontact Printing and Its Application to ToF-SIMS to Probe Surface Energies

LANGMUIR

IF3.9

2009-04-09

PREAI

Yang, Li; Shirahata, Naoto; Saini, Gaurav; Zhang, Feng; Pei, Lei; Asplund, Matthew C.; Kurth, Dirk G.; Ariga, Katsuhiko; Sautter, Ken; Nakanishi, Takashi; Smentkowski, Vincent; Linford, Matthew R.

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Multivariate statistical analysis of three-spatial-dimension TOF-SIMS raw data sets

ANALYTICAL CHEMISTRY

IF6.7

2007-09-14

PREAI

Smentkowski, V. S.; Ostrowski, S. G.; Braunstein, E.; Keenan, M. R.; Ohlhausen, J. A. Tony; Kotula, P. G.

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Direct adsorption and detection of proteins, including ferritin, onto microlens array patterned bioarrays

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

IF15.6

2007-07-10

PREAI

Zhang, Feng; Gates, Richard J.; Smentkowski, Vincent S.; Natarajan, Sriram; Gale, Bruce K.; Watt, Richard K.; Asplund, Matthew C.; Linford, Matthew R.

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Laser activation-modification of semiconductor surfaces (LAMSS) of 1-alkenes on silicon: A ToF-SIMS, chemometrics, and AFM analysis

APPLIED SURFACE SCIENCE

IF6.9

2007-04-01

PREAI

Pei, Lei; Jiang, Guilin; Davis, Robert C.; Shaver, Jeremy M.; Smentkowski, Vincent S.; Asplund, Matthew C.; Linford, Matthew R.

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Laser activation modification of semiconductor surfaces (LAMSS)

LANGMUIR

IF3.9

2006-11-03

PREAI

Zhang, Feng; Pei, Lei; Bennion, Eliot; Jiang, Guilin; Connley, David; Yang, Li; Lee, Michael V.; Davis, Robert C.; Smentkowski, Vincent S.; Strossman, Greg; Linford, Matthew R.; Asplund, Matthew C.

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Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate

APPLIED SURFACE SCIENCE

IF6.9

2006-11-01

PREAI

Smentkowski, V. S.; Duong, H. M.; Tamaki, R.; Keenan, M. R.; Ohlhausen, J. A. Tony; Kotula, P. G.

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Matrix implanted laser desorption ionization (MILDI) combined with ion mobility-mass spectrometry for bio-surface analysis

JOURNAL OF PROTEOME RESEARCH

IF3.6

2005-03-16

PREAI

Tempez, A; Ugarov, M; Egan, T; Schultz, JA; Novikov, A; Della-Negra, S; Lebeyec, Y; Pautrat, M; Caroff, M; Smentkowski, VS; Wang, HYJ; Jackson, SN; Woods, AS

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Multivariate statistical analysis of concatenated time-of-flight secondary ion mass spectrometry spectral images. Complete description of the sample with one analysis

ANALYTICAL CHEMISTRY

IF6.7

2005-01-26

PREAI

Smentkowski, VS; Keenan, MR; Ohlhausen, JA; Kotula, PG

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Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images-looking beyond the obvious

APPLIED SURFACE SCIENCE

IF6.9

2004-06-01