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SaveAnalysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling
Wintersberger, E.; Hrauda, N.; Kriegner, D.; Keplinger, M.; Springholz, G.; Stangl, J.; Bauer, G.; Oswald, J.; Belytschko, T.; Deiter, C.; Bertram, F.; Seeck, O. H.
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SaveMaterials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system
To, Albert C.; Liu, Wing Kam; Olson, Gregory B.; Belytschko, Ted; Chen, Wei; Shephard, Mark S.; Chung, Yip-Wah; Ghanem, Roger; Voorhees, Peter W.; Seidman, David N.; Wolverton, Chris; Chen, J. S.; Moran, Brian; Freeman, Arthur J.; Tian, Rong; Luo, Xiaojuan; Lautenschlager, Eric; Challoner, A. Dorian
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