Not logged inDisplacement Talbot lithography for nano-engineering of III-nitride materials
Coulon, Pierre-Marie; Damilano, Benjamin; Alloing, Blandine; Chausse, Pierre; Walde, Sebastian; Enslin, Johannes; Armstrong, Robert; Vezian, Stephane; Hagedorn, Sylvia; Wernicke, Tim; Massies, Jean; Zuniga-Perez, Jesus; Weyers, Markus; Kneissl, Michael; Shields, Philip A.
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SaveOptical investigations of bulk and multi-quantum well nitride-based microcavities
Reveret, F.; Medard, F.; Disseix, P.; Leymarie, J.; Mihailovic, M.; Vasson, A.; Sellers, I. R.; Semond, F.; Leroux, M.; Massies, J.
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SaveAnalysis of the characteristic temperatures of (Ga,In)(N,As)/GaAs laser diodes
Montes, M.; Hierro, A.; Ulloa, J. M.; Guzman, A.; Damilano, B.; Hugues, M.; Al Khalfioui, M.; Duboz, J-Y; Massies, J.
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SavePolariton relaxation bottleneck and its thermal suppression in bulk GaN microcavities
Stokker-Cheregi, F.; Vinattieri, A.; Semond, F.; Leroux, M.; Sellers, I. R.; Massies, J.; Solnyshkov, D.; Malpuech, G.; Colocci, M.; Gurioli, M.
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