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Zhiguo Wen

beijing smartchip microelectronics technology co. ltd., beijing 100192, china

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2Paper Count
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Published Papers 1
Publication Date
Induced-Charge Assisted Faradaic Capacitive Deionization: A New Paradigm to Break the Capacity-Rate Trade-off
err2026-02-04
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PREAI
errShihao Zhu; Junhui Wang; Junfeng Li; Yuquan Li; Zhiguo Wen; Hengchao Sun; Yong Liu; Zeqiu Chen; Likun Pan
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