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SaveShare Save Share Save Share Save Share Save Tensile stress-driven cracking of W fuzz over W crystal under fusion-relevant He ion irradiations
Fan, Hongyu; Zhang, Yang; Liu, Dongping; Niu, Chunjie; Liu, Lu; Ni, Weiyuan; Xia, Yang; Bi, Zhenhua; Hong, Yi; Benstetter, Guenther; Lei, Guangjiu Share Save Share Save The evolution of He nanobubbles in tungsten under fusion-relevant He ion irradiation conditionsBi, Zhenhua; Liu, Dongping; Zhang, Yang; Liu, Lu; Xia, Yang; Hong, Yi; Fan, Hongyu; Benstetter, Guenther; Lei, Guangjiu; Yan, Longwen Share Save Share Save Share Save On the Limits of Scalpel AFM for the 3D Electrical Characterization of NanomaterialsChen, Shaochuan; Jiang, Lanlan; Buckwell, Mark; Jing, Xu; Ji, Yanfeng; Grustan-Gutierrez, Enric; Hui, Fei; Shi, Yuanyuan; Rommel, Mathias; Paskaleva, Albena; Benstetter, Guenther; Ng, Wing H.; Mehonic, Adnan; Kenyon, Anthony J.; Lanza, Mario Share Save Share Save Transparent flexible thermoelectric material based on non-toxic earth-abundant p-type copper iodide thin filmYang, C.; Souchay, D.; Kneiss, M.; Bogner, M.; Wei, M.; Lorenz, M.; Oeckler, O.; Benstetter, G.; Fu, Y. Q.; Grundmann, M. Share Save Share Save Fabrication of scalable and ultra low power photodetectors with high light/dark current ratios using polycrystalline monolayer MoS2 sheetsJing, Xu; Panholzer, Emanuel; Song, Xiaoxue; Grustan-Gutierrez, Enric; Hui, Fei; Shi, Yuanyuan; Benstetter, Guenther; Illarionov, Yury; Grasser, Tibor; Lanza, Mario Share Save Share Save Share Save Share Save Share Save Degradation of polycrystalline HfO2-based gate dielectrics under nanoscale electrical stress (vol 99, 103510, 2011)Iglesias, V.; Lanza, M.; Zhang, K.; Bayerl, A.; Porti, M.; Nafria, M.; Aymerich, X.; Benstetter, G.; Shen, Z. Y.; Bersuker, G. Share Save 
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