arrow
Back
O

Omur E. Dagdeviren

école de technologie supérieure

14H-index
58Paper Count
526Citation Count
Published Papers 23
Publication Date
Defect- and Geometry-Controlled Fermi-Level Dynamics in TiO2
err2026-06-10
err0
PREAI
errMohammad Safikhani-Mahmoudi; Nuray Basaran; Bugrahan Guner; Tugce Hacaloglu; Omur E. Dagdeviren
errShare
errSave
Standardizing Force Reconstruction in Dynamic Atomic Force Microscopy
err2025-12-01
err0
PREAI
errLaflamme, Simon; Guner, Bugrahan; Dagdeviren, Omur E.
errShare
errSave
Time-Resolved Mapping of Charge Carrier Dynamics and Defect-Mediated Migration Barriers in TiO2
err2025-09-01
err0
PREAI
errGuner, Bugrahan; Safikhani-Mahmoudi, Mohammad; Dagdeviren, Omur E.
errShare
errSave
Ultraviolet irradiation penetration depth on TiO2
err2025-03-16
err0
errOAAI
errGuner, Bugrahan; Safikhani-Mahmoudi, Mohammad; Li, Fengmiao; Zou, Ke; Dagdeviren, Omur E.
errShare
errSave
errShare
errSave
The Effect of Photoinduced Surface Oxygen Vacancies on the Charge Carrier Dynamics in TiO2 Films
err2021-09-28
err40
errOAAI
errDagdeviren, Omur E.; Glass, Daniel; Sapienza, Riccardo; Cortes, Emiliano; Maier, Stefan A.; Parkin, Ivan P.; Grutter, Peter; Quesada-Cabrera, Raul
errShare
errSave
Atomic-scale homogeneous plastic flow beyond near-theoretical yield stress in a metallic glass
err2021-02-26
err13
errOAAI
errYu, Jiaxin; Datye, Amit; Chen, Zheng; Zhou, Chao; Dagdeviren, Omur E.; Schroers, Jan; Schwarz, Udo D.
errShare
errSave
Ergodic and Nonergodic Dynamics of Oxygen Vacancy Migration at the Nanoscale in Inorganic Perovskites
err2020-09-24
err10
PREAI
errDagdeviren, Omur E.; Mascaro, Aaron; Yuan, Shuaishuai; Shirani, Javad; Bevan, Kirk H.; Grutter, Peter
errShare
errSave
Relaxation and crystallization studied by observing the surface morphology evolution of atomically flat Pt57.5Cu14.7Ni53P22.5 upon annealing
err2020-06-01
err10
errOAAI
errChen, Zheng; Datye, Amit; Ketkaew, Jittisa; Sohn, Sungwoo; Zhou, Chao; Dagdeviren, Omur E.; Schroers, Jan; Schwarz, Udo D.
errShare
errSave
Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy
errSENSORS
IF3.5
err2019-10-17
err6
errOAAI
errDagdeviren, Omur E.; Miyahara, Yoichi; Mascaro, Aaron; Enright, Tyler; Grutter, Peter
errShare
errSave
Revealing surface-state transport in ultrathin topological crystalline insulator SnTe films
err2019-05-15
err17
errOAAI
errZou, Ke; Albright, Stephen D.; Dagdeviren, Omur E.; Morales-Acosta, M. D.; Simon, Georg H.; Zhou, Chao; Mandal, Subhasish; Ismail-Beigi, Sohrab; Schwarz, Udo D.; Altman, Eric I.; Walker, Frederick J.; Ahn, Charles H.
errShare
errSave
errShare
errSave
Eliminating the effect of acoustic noise on cantilever spring constant calibration
err2018-12-07
err5
errOAAI
errMascaro, Aaron; Miyahara, Yoichi; Dagdeviren, Omur E.; Grutter, Peter
errShare
errSave
Suppression of the spectral weight of topological surface states on the nanoscale via local symmetry breaking
err2018-11-20
err5
errOAAI
errDagdeviren, Omur E.; Mandal, Subhasish; Zou, Ke; Zhou, Chao; Simon, Georg H.; Walker, Frederick J.; Ahn, Charles H.; Schwarz, Udo D.; Ismail-Beigi, Sohrab; Altman, Eric, I
errShare
errSave
Atomic imprinting into metallic glasses
err2018-11-05
err39
errOAAI
errLi, Rui; Chen, Zheng; Datye, Amit; Simon, Georg H.; Ketkaew, Jittisa; Kinser, Emily; Liu, Ze; Zhou, Chao; Dagdeviren, Omur E.; Sohn, Sungwoo; Singer, Jonathan P.; Osuji, Chinedum O.; Schroers, Jan; Schwarz, Udo D.
errShare
errSave
Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis
err2018-04-26
err22
errOAAI
errDagdeviren, Omur E.; Zhou, Chao; Altman, Eric I.; Schwarz, Udo D.
errShare
errSave