Not logged in
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
Save
Share
SaveAssessment of the complete chain evolution process of LIBs from micro internal short circuit failure to thermal runaway under mechanical abuse conditions
Li, Yuxuan; Zhang, Ningjie; Jiang, Lihua; Wei, Zesen; Zhang, Yue; Yu, Yin; Song, Laifeng; Wang, Linjun; Duan, Qiangling; Sun, Jinhua; Wang, Qingsong
Share
Save