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Mark Buckwell

university college london

17H-index
94Paper Count
1.6KCitation Count
Published Papers 23
Publication Date
4D insights into lithium-ion battery sidewall rupture during thermal runaway
err2026-02-05
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errOAAI
errMatilda Fransson; Ludovic Broche; Jonas Pfaff; Matteo Venturelli; Mark Buckwell; Arthur Fordham; Charlie Kirchner-Burles; Hamish T. Reid; Mahesh Thalwaththe Gedara; Sebastian Schopferer; Donal P. Finegan; James Robinson; Rhodri Jervis; Alexander Rack; Eric Darcy; Paul Shearing
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Safety and performance implications of lithium plating induced by sub-zero temperature cycling of lithium-ion batteries
err2025-10-08
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errOAAI
errCharles Kirchner-Burles; Arthur Fordham; Hamish T. Reid; Michael Johnson; Mark Buckwell; Francesco Iacoviello; Kofi Coke; Rhodri Jervis; Gareth Hinds; Paul R. Shearing; James B. Robinson
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Roadmap to neuromorphic computing with emerging technologies
err2024-10-21
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errOAAI
errMehonic, Adnan; Ielmini, Daniele; Roy, Kaushik; Mutlu, Onur; Kvatinsky, Shahar; Serrano-Gotarredona, Teresa; Linares-Barranco, Bernabe; Spiga, Sabina; Savel'ev, Sergey; Balanov, Alexander G.; Chawla, Nitin; Desoli, Giuseppe; Malavena, Gerardo; Monzio Compagnoni, Christian; Wang, Zhongrui; Yang, J. Joshua; Sarwat, Syed Ghazi; Sebastian, Abu; Mikolajick, Thomas; Slesazeck, Stefan; Noheda, Beatriz; Dieny, Bernard; Hou, Tuo-Hung (Alex); Varri, Akhil; Brueckerhoff-Plueckelmann, Frank; Pernice, Wolfram; Zhang, Xixiang; Pazos, Sebastian; Lanza, Mario; Wiefels, Stefan; Dittmann, Regina; Ng, Wing H.; Buckwell, Mark; Cox, Horatio R. J.; Mannion, Daniel J.; Kenyon, Anthony J.; Lu, Yingming; Yang, Yuchao; Querlioz, Damien; Hutin, Louis; Vianello, Elisa; Chowdhury, Sayeed Shafayet; Mannocci, Piergiulio; Cai, Yimao; Sun, Zhong; Pedretti, Giacomo; Strachan, John Paul; Strukov, Dmitri; Le Gallo, Manuel; Ambrogio, Stefano; Valov, Ilia; Waser, Rainer
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The Role of Hydrogen in ReRAM
err2024-10-14
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errOAAI
errCox, Horatio R. J.; Sharpe, Matthew K.; McAleese, Callum; Laitinen, Mikko; Dulai, Jeevan; Smith, Richard; England, Jonathan; Ng, Wing H.; Buckwell, Mark; Zhao, Longfei; Fearn, Sarah; Mehonic, Adnan; Kenyon, Anthony J.
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Exploring thermal runaway propagation in Li-ion batteries through high-speed X-ray imaging and thermal analysis: Impact of cell chemistry and electrical connections
err2024-10-01
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errOAAI
errFransson, Matilda; Pfaff, Jonas; Broche, Ludovic; Buckwell, Mark; Kirchner-Burles, Charlie; Reid, Hamish T.; Schopferer, Sebastian; Rack, Alexander; Finegan, Donal P.; Shearing, Paul R.
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High-Speed Imaging for Investigating Battery Failure Mechanisms
err2024-09-01
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PREAI
errReid, Hamish T.; Kesuma, Inez; Buckwell, Mark; Robinson, James B.; Shearing, Paul R.
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Investigating the Performance and Safety of Li-Ion Cylindrical Cells Using Acoustic Emission and Machine Learning Analysis
err2024-07-11
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errOAAI
errFordham, Arthur; Joo, Seung-Bin; Owen, Rhodri E.; Galiounas, Elias; Buckwell, Mark; Brett, Dan J. L.; Shearing, Paul R.; Jervis, Rhodri; Robinson, James B.
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The battery failure databank: Insights from an open-access database of thermal runaway behaviors of Li-ion cells and a resource for benchmarking risks
err2024-03-01
err14
errOAAI
errFinegan, Donal P.; Billman, Julia; Darst, Jacob; Hughes, Peter; Trillo, Jesus; Sharp, Matt; Benson, Alex; Pham, Martin; Kesuma, Inez; Buckwell, Mark; Reid, Hamish T.; Kirchner-Burles, Charlie; Fransson, Matilda; Petrushenko, David; Heenan, Thomas M. M.; Jervis, Rhodri; Owen, Rhodri; Patel, Drasti; Broche, Ludovic; Rack, Alexander; Magdysyuk, Oxana; Keyser, Matt; Walker, William; Shearing, Paul; Darcy, Eric
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Up in smoke: Considerations for lithium-ion batteries in disposable e-cigarettes
errJOULE
IF35.4
err2023-12-01
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errOAAI
errReid, Hamish T.; Fordham, Arthur; Rasha, Lara; Buckwell, Mark; Brett, Daniel J. L.; Jervis, Rhodri; Shearing, Paul R.
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Sidewall breach during lithium-ion battery thermal runaway triggered by cell-to-cell propagation visualized using high-speed X-ray imaging
err2023-11-01
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errOAAI
errFransson, Matilda; Broche, Ludovic; Buckwell, Mark; Pfaff, Jonas; Reid, Hamish; Kirchner-Burles, Charlie; Pham, Martin; Moser, Stefan; Rack, Alexander; Nau, Siegfried; Schopferer, Sebastian; Finegan, Donal P.; Shearing, Paul
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Failure and hazard characterisation of high-power lithium-ion cells via coupling accelerating rate calorimetry with in-line mass spectrometry, statistical and post-mortem analyses
err2023-08-01
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errOAAI
errBuckwell, Mark; Kirchner-Burles, Charlie; Owen, Rhodri E.; Neville, Tobias P.; Weaving, Julia S.; Brett, Daniel J. L.; Shearing, Paul R.
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In situ chamber for studying battery failure using high-speed synchrotron radiography
err2023-01-01
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errOAAI
errPfaff, Jonas; Fransson, Matilda; Broche, Ludovic; Buckwell, Mark; Finegan, Donal P.; Moser, Stefan; Schopferer, Sebastian; Nau, Siegfried; Shearing, Paul R.; Rack, Alexander
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Quantitative spatiotemporal mapping of thermal runaway propagation rates in lithium-ion cells using cross-correlated Gabor filtering
err2022-01-01
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errOAAI
errRadhakrishnan, Anand N. P.; Buckwell, Mark; Pham, Martin; Finegan, Donal P.; Rack, Alexander; Hinds, Gareth; Brett, Dan J. L.; Shearing, Paul R.
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Neuromorphic Dynamics at the Nanoscale in Silicon Suboxide RRAM
err2021-12-22
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errOAAI
errBuckwell, Mark; Ng, Wing H.; Mannion, Daniel J.; Cox, Horatio R. J.; Hudziak, Stephen; Mehonic, Adnan; Kenyon, Anthony J.
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A nanoscale analysis method to reveal oxygen exchange between environment, oxide, and electrodes in ReRAM devices
err2021-11-09
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errOAAI
errCox, Horatio R. J.; Buckwell, Mark; Ng, Wing H.; Mannion, Daniel J.; Mehonic, Adnan; Shearing, Paul R.; Fearn, Sarah; Kenyon, Anthony J.
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Simulation of Inference Accuracy Using Realistic RRAM Devices
err2019-06-12
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errOAAI
errMehonic, Adnan; Joksas, Dovydas; Ng, Wing H.; Buckwell, Mark; Kenyon, Anthony J.
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The interplay between structure and function in redox-based resistance switching
err2019-01-01
err16
errOAAI
errKenyon, Anthony J.; Munde, Manveer Singh; Ng, Wing H.; Buckwell, Mark; Joksas, Dovydas; Mehonic, Adnan
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On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials
err2018-11-12
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errOAAI
errChen, Shaochuan; Jiang, Lanlan; Buckwell, Mark; Jing, Xu; Ji, Yanfeng; Grustan-Gutierrez, Enric; Hui, Fei; Shi, Yuanyuan; Rommel, Mathias; Paskaleva, Albena; Benstetter, Guenther; Ng, Wing H.; Mehonic, Adnan; Kenyon, Anthony J.; Lanza, Mario
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Spike-Timing Dependent Plasticity in Unipolar Silicon Oxide RRAM Devices
err2018-02-08
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errOAAI
errZarudnyi, Konstantin; Mehonic, Adnan; Montesi, Luca; Buckwell, Mark; Hudziak, Stephen; Kenyon, Anthony J.
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Intrinsic Resistance Switching in Amorphous Silicon Suboxides: The Role of Columnar Microstructure
err2017-08-24
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errOAAI
errMunde, M. S.; Mehonic, A.; Ng, W. H.; Buckwell, M.; Montesi, L.; Bosman, M.; Shluger, A. L.; Kenyon, A. J.
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