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Ohmyoung Kwon

Korea University

24H-index
94Paper Count
2.0KCitation Count
Published Papers 23
Publication Date
Phase separation and interface effect in pseudo-quaternary composites of AgxBi0.5Sb1.5-xTe3-x
err2017-06-01
err1
PREAI
errSong, Yoo Jang; Lydia, R.; Lin, Chan-Chieh; Rhyee, Jong-Soo; Chung, J.; Kwon, Ohmyoung; Park, Su Dong; Kim, Bong Seo
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In-Plane Thermal Conductivity of Polycrystalline Chemical Vapor Deposition Graphene with Controlled Grain Sizes
err2017-03-06
err76
PREAI
errLee, Woomin; Kihm, Kenneth David; Kim, Hong Goo; Shin, Seungha; Lee, Changhyuk; Park, Jae Sung; Cheon, Sosan; Kwon, Oh Myoung; Lim, Gyumin; Lee, Woorim
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Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning thermal wave microscopy
err2016-02-18
err2
PREAI
errPark, Kyungbae; Hwang, Gwangseok; Kim, Hayeong; Kim, Jungwon; Kim, Woochul; Kim, Sungjin; Kwon, Ohmyoung
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Investigating the origin of efficiency droop by profiling the temperature across the multi-quantum well of an operating light-emitting diode
err2015-01-30
err18
PREAI
errJung, Euihan; Hwang, Gwangseok; Chung, Jaehun; Kwon, Ohmyoung; Han, Jaecheon; Moon, Yong-Tae; Seong, Tae-Yeon
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Measuring the thermal conductivity of residue-free suspended graphene bridge using null point scanning thermal microscopy
errCARBON
IF11.6
err2014-09-01
err54
PREAI
errYoon, Kichul; Hwang, Gwangseok; Chung, Jaehun; Kim, Hong Goo; Kwon, Ohmyoung; Kihm, Kenneth David; Lee, Joon Sik
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Quantitative temperature profiling through null-point scanning thermal microscopy
err2012-12-01
err39
PREAI
errChung, J.; Kim, K.; Hwang, G.; Kwon, O.; Choi, Y. K.; Lee, J. S.
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Quantitative Thermopower Profiling across a Silicon p-n Junction with Nanometer Resolution
err2012-08-16
err12
PREAI
errLee, Byeonghee; Kim, Kyeongtae; Lee, Seungkoo; Kim, Jong Hoon; Lim, Dae Soon; Kwon, Ohmyoung; Lee, Joon Sik
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Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air
err2011-10-19
err121
PREAI
errKim, Kyeongtae; Chung, Jaehun; Hwang, Gwangseok; Kwon, Ohmyoung; Lee, Joon Sik
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Quantitative scanning thermal microscopy using double scan technique
err2008-11-20
err61
PREAI
errKim, Kyeongtae; Chung, Jaehoon; Won, Jongbo; Kwon, Ohmyoung; Lee, Joon Sik; Park, Seung Ho; Choi, Young Ki
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The effect of electrode heat sink in organic-electronic devices
err2008-11-04
err32
PREAI
errChoi, Sang Hun; Lee, Tae Il; Baik, Hong Koo; Roh, Hee Hwan; Kwon, Ohmyoung; Suh, Dong hak
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Improvement of uncooled infrared imaging detector by using mesoporous silica as a thermal isolation layer
err2008-05-01
err27
PREAI
errChoi, Sun Gyu; Ha, Tae-Jung; Yu, Byoung-Gon; Jaung, Seung Pil; Kwon, Ohmyoung; Park, Hyung-Ho
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Thermopower profiling of a silicon p-n junction
err2007-01-23
err7
PREAI
errKim, Kyeongtae; Park, Jisang; Kim, Sun Ung; Kwon, Ohmyoung; Lee, Joon Sik; Park, Seungho Ho; Choi, Young Ki
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