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Irène Gijbels
H-index:40
Citation Count:8,175
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Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218
修正：Amato等人。利用半导体生产中通过SEM检测到的缺陷来检测重要特征和预测产量。传感器 2025, 25, 4218
Sensors
IF3.5
