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R

Ryan Dehoff

oak ridge national laboratory

59H-index
333Paper Count
1.5WCitation Count
Published Papers 51
Publication Date
logo
errPowder Technology
IF4.6
err2025-08-11
err0
PREAI
errSubrato Sarkar; Jason R. Mayeur; K.P.K. Ajjarapu; Fred A. List; Soumya Nag; Ryan R. Dehoff
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errSave
errINTERMETALLICS
IF4.8
err2025-07-01
err0
PREAI
errPerrin, A. E.; Zhong, W.; Osetskiy, Y.; Plotkowski, A.; Joslin, C. B.; An, K.; Keum, Jong; Veith, G. M.; Dehoff, R. R.; Yang, Y.
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errSave
errMATERIALS CHARACTERIZATION
IF5.5
err2024-11-01
err0
PREAI
errRahman, Obaidullah; Rakhmonov, Jovid; Bahl, Sumit; Frederick, Curtis; Shyam, Amit; Dehoff, Ryan; Plotkowski, Alex; Ziabari, Amirkoushyar
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errSave
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2024-07-31
err1
PREAI
errPeles, Amra; Paquit, Vincent C.; Dehoff, Ryan R.
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errSave
errMATERIALS
IF3.2
err2023-11-23
err6
errOAAI
errScime, Luke; Joslin, Chase; Collins, David A.; Sprayberry, Michael; Singh, Alka; Halsey, William; Duncan, Ryan; Snow, Zackary; Dehoff, Ryan; Paquit, Vincent
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errSave
errNPJ COMPUTATIONAL MATERIALS
IF11.9
err2023-05-30
err20
errOAAI
errZiabari, Amirkoushyar; Venkatakrishnan, S. V.; Snow, Zackary; Lisovich, Aleksander; Sprayberry, Michael; Brackman, Paul; Frederick, Curtis; Bhattad, Pradeep; Graham, Sarah; Bingham, Philip; Dehoff, Ryan; Plotkowski, Alex; Paquit, Vincent
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errSave
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2023-03-01
err5
errOAAI
errSisco, Kevin D.; Plotkowski, Alex; Yang, Ying; Allard, Larry; Fancher, Chris; Rawn, Claudia; Poplawsky, Jonathan D.; Dehoff, Ryan; Babu, S. S.
errShare
errSave
errACTA MATERIALIA
IF9.3
err2023-01-01
err14
errOAAI
errMichi, Richard A.; Bahl, Sumit; Fancher, Christopher M.; Sisco, Kevin; Allard, Lawrence F.; An, Ke; Yu, Dunji; Dehoff, Ryan R.; Plotkowski, Alex; Shyam, Amit
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errSave
errMATERIALS CHARACTERIZATION
IF5.5
err2022-08-01
err18
errOAAI
errPolonsky, Andrew T.; Raghavan, Narendran; Echlin, McLean P.; Kirka, Michael M.; Dehoff, Ryan R.; Pollock, Tresa M.
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errSave
errMATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
IF7
err2022-04-01
err28
errOAAI
errMichi, Richard A.; Sisco, Kevin; Bahl, Sumit; Allard, Lawrence F.; Wagner, Karla B.; Poplawsky, Jonathan D.; Leonard, Donovan N.; Dehoff, Ryan R.; Plotkowski, Alex; Shyam, Amit
errShare
errSave
errACTA MATERIALIA
IF9.3
err2022-04-01
err92
errOAAI
errMichi, Richard A.; Sisco, Kevin; Bahl, Sumit; Yang, Ying; Poplawsky, Jonathan D.; Allard, Lawrence F.; Dehoff, Ryan R.; Plotkowski, Alex; Shyam, Amit
errShare
errSave
errACTA MATERIALIA
IF9.3
err2021-11-01
err63
errOAAI
errBahl, Sumit; Plotkowski, Alex; Sisco, Kevin; Leonard, Donovan N.; Allard, Lawrence F.; Michi, Richard A.; Poplawsky, Jonathan D.; Dehoff, Ryan; Shyam, Amit
errShare
errSave
errINTERNATIONAL MATERIALS REVIEWS
IF15.5
err2021-07-16
err156
errOAAI
errMichi, Richard A.; Plotkowski, Alex; Shyam, Amit; Dehoff, Ryan R.; Babu, Sudarsanam Suresh
errShare
errSave
errMATERIALS CHARACTERIZATION
IF5.5
err2021-06-01
err0
PREAI
errPolonsky, Andrew T.; Echlin, McLean P.; Lenthe, William C.; Dehoff, Ryan R.; Kirka, Michael M.; Pollock, Tresa M.
errShare
errSave
errSCIENTIFIC REPORTS
IF3.9
err2021-03-26
err70
errOAAI
errSisco, K.; Plotkowski, A.; Yang, Y.; Leonard, D.; Stump, B.; Nandwana, P.; Dehoff, R. R.; Babu, S. S.
errShare
errSave
errOPTICS EXPRESS
IF3.3
err2021-03-16
err22
errOAAI
errHaley, James; Leach, Clay; Jordan, Brian; Dehoff, Ryan; Paquit, Vincent
errShare
errSave
errMATERIALS CHARACTERIZATION
IF5.5
err2021-03-01
err14
errOAAI
errCakmak, Ercan; Bingham, Philip; Cunningham, Ross W.; Rollett, Anthony D.; Xiao, Xianghui; Dehoff, Ryan R.
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errSave
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2020-12-01
err27
errOAAI
errYang, Y.; Bahl, S.; Sisco, K.; Lance, M.; Shin, D.; Shyam, A.; Plotkowski, A.; Dehoff, R. R.
errShare
errSave
errMATERIALS TODAY COMMUNICATIONS
IF4.5
err2020-12-01
err20
errOAAI
errNandwana, Peeyush; Plotkowski, Alex; Kannan, Rangasayee; Yoder, Sean; Dehoff, Ryan
errShare
errSave
errNATURE COMMUNICATIONS
IF15.7
err2020-10-02
err158
errOAAI
errMurray, Sean P.; Pusch, Kira M.; Polonsky, Andrew T.; Torbet, Chris J.; Seward, Gareth G. E.; Zhou, Ning; Forsik, Stephane A. J.; Nandwana, Peeyush; Kirka, Michael M.; Dehoff, Ryan R.; Slye, William E.; Pollock, Tresa M.
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errSave

Research Directions

No research directions
Co-authors
Cooperation Journals
S
Sheng Dai
H-index: 153 · Papers: 1.5K
M
Miaofang Chi
H-index: 98 · Papers: 534
T
Tresa M. Pollock
H-index: 84 · Papers: 613
A
Anthony D. Rollett
H-index: 79 · Papers: 625
G
Gabriel M. Veith
H-index: 79 · Papers: 466
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