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John W. Halloran

University of Michigan

58H-index
265Paper Count
1.1WCitation Count
Published Papers 91
Publication Date
Damage evolution in SiC/SiC unidirectional composites by X-ray tomography
err2020-01-30
err40
errOAAI
errHilmas, Ashley M.; Sevener, Kathleen M.; Halloran, John W.
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The role of ceramic and glass science research in meeting societal challenges: Report from an NSF-sponsored workshop
err2017-04-21
err24
errOAAI
errFaber, Katherine T.; Asefa, Tewodros; Backhaus-Ricoult, Monika; Brow, Richard; Chan, Julia Y.; Dillon, Shen; Fahrenholtz, William G.; Finnis, Michael W.; Garay, Javier E.; Garcia, R. Edwin; Gogotsi, Yury; Haile, Sossina M.; Halloran, John; Hu, Juejun; Huang, Liping; Jacobsen, Steven D.; Lara-Curzio, Edgar; LeBeau, James; Lee, William E.; Levi, Carlos G.; Levin, Igor; Lewis, Jennifer A.; Lipkin, Don M.; Lu, Kathy; Luo, Jian; Maria, Jon-Paul; Martin, Lane W.; Martin, Steve; Messing, Gary; Navrotsky, Alexandra; Padture, Nitin P.; Randall, Clive; Rohrer, Gregory S.; Rosenflanz, Anatoly; Schaedler, Tobias A.; Schlom, Darrell G.; Sehirlioglu, Alp; Stevenson, Adam J.; Tani, Toshihiko; Tikare, Veena; Trolier-McKinstry, Susan; Wang, Hong; Yildiz, Bilge
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Dielectric loss in porous TiO2
err2017-04-01
err19
errOAAI
errWing, Zachary N.; Halloran, John W.
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Microstress in Reaction-Bonded SiC from Crystallization Expansion of Silicon
err2016-07-28
err22
errOAAI
errWing, Bradley L.; Esmonde-White, Francis; Halloran, John W.
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