logo
CanyamAI summaries for academic research
language
MobileMobile
  • Phone FeatureWeChat Mini Program
EnglishEnglish
noticeNotice
BlogBlog
delete
arrow
Back
V

Vincent Schellekens

Ohio State University

5H-index
24Paper Count
97Citation Count
Published Papers 3
Publication Date
logo
Advancing silicon die area estimation for integrated circuit modeling in life-cycle assessments
errInternational Journal of Life Cycle Assessment
IF5.4
err2026-10-05
err0
PREAI
errAugustin Wattiez; Anne-Sophie Collin; Robin Dethienne; Tomasz Rola; Marina Proske; Thibault Pirson; Vincent Schellekens; David Bol
errShare
errSave
Sketching Data Sets for Large-Scale Learning: Keeping only what you need
errIEEE SIGNAL PROCESSING MAGAZINE
IF9.6
err2021-09-01
err11
errOAAI
errGribonval, Remi; Chatalic, Antoine; Keriven, Nicolas; Schellekens, Vincent; Jacques, Laurent; Schniter, Philip
errShare
errSave
Quantized Compressive K-Means
errieee signal processing magazine
IF3.9
err2018-08-01
err14
errOAAI
errSchellekens, Vincent; Jacques, Laurent
errShare
errSave

Research Directions

The data has not been retrieved yet.
Co-authors
Cooperation Journals
R
Rémi Gribonval
H-index: 55 · Papers: 489
P
Philip Schniter
H-index: 49 · Papers: 262
D
David Bol
H-index: 29 · Papers: 221
L
Laurent Jacques
H-index: 27 · Papers: 297
T
Thibault Pirson
H-index: 8 · Papers: 16
View more