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Advanced Scanning Probe Nanolithography Using GaN Nanowires Behzadirad, Mahmoud; Mecholdt, Stephan; Randall, John N.; Ballard, Joshua B.; Owen, James; Rishinaramangalam, Ashwin K.; Reum, Alexander; Gotszalk, Teodor; Feezell, Daniel F.; Rangelow, Ivo W.; Busani, Tito Share Save
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Digermane Deposition on Si(100) and Ge(100): from Adsorption Mechanism to Epitaxial Growth Dick, Don; Veyan, Jean-Francois; Longo, R. C.; McDonnell, Stephen; Ballard, Josh B.; Qin, Xiaoye; Dong, Hong; Owen, James H. G.; Randall, John N.; Wallace, Robert M.; Cho, Kyeongjae; Chabal, Yves J. Share Save
Controlling the Atomic Layer Deposition of Titanium Dioxide on Silicon: Dependence on Surface Termination McDonnell, Stephen; Longo, Roberto C.; Seitz, Oliver; Ballard, Josh B.; Mordi, Greg; Dick, Don; Owen, James H. G.; Randall, John N.; Kim, Jiyoung; Chabal, Yves J.; Cho, Kyeongjae; Wallace, Robert M. Share Save
Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography Schmucker, S. W.; Kumar, N.; Abelson, J. R.; Daly, S. R.; Girolami, G. S.; Bischof, M. R.; Jaeger, D. L.; Reidy, R. F.; Gorman, B. P.; Alexander, J.; Ballard, J. B.; Randall, J. N.; Lyding, J. W. Share Save
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Si2H6 Dissociative Chemisorption and Dissociation on Si(100)-(2x1) and Ge(100)-(2x1) Veyan, Jean-Francois; Choi, Heesung; Huang, Min; Longo, R. C.; Ballard, Josh B.; McDonnell, Stephen; Nadesalingam, Manori P.; Dong, Hong; Chopra, Irinder S.; Owen, James H. G.; Kirk, Wiley P.; Randall, John N.; Wallace, Robert M.; Cho, Kyeongjae; Chabal, Yves J. Share Save
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